TASMIT, INC.

Optical inspection apparatus for visually inspecting semiconductor wafers; Optical inspection apparatus for inspecting the appearance of semiconductor wafers; Inspection machines for the optical inspection of semiconductor wafers; Inspection machines for the optical inspection of the appearance of semiconductor wafers; Optical inspection apparatus for visually inspecting the glass substrates in rectangular shape of semiconductor; Optical inspection apparatus for inspecting the appearance of glass substrates in rectangular shape of semiconductor; Inspection machines for the optical inspection of glass substrates in rectangular shape of semiconductor; Inspection machines for the optical inspection of the appearance of glass substrates in rectangular shape of semiconductor

Semiconductor manufacturing machines and systems | Measuring instruments, namely, machine that measures pattern defects and critical dimensions of semiconductor devices; Electric and magnetic meters; Semiconductor device testers in the nature of semiconductor testing apparatus; Electronic machines and apparatus, namely, semiconductor wafer geometry verification system and structural parts therefor; Semiconductor inspection equipment, namely, optical inspection apparatus for inspection of semiconductor materials, in particular, semiconductor wafers and electron beam semiconductor wafer pattern verification system and structural parts therefor; Inspection equipment for electrical characteristics of semiconductors, namely, optical inspection apparatus for inspection of semiconductor materials, in particular, semiconductor wafers; Electron microscopes; Semi-conductors; Semiconductor testing apparatus | Inspection services in the fields of semiconductor; Providing information and consultancy in the field of inspection of semiconductor; Consultancy in the field of design of semiconductor

SEMICONDUCTOR TESTERS; ELECTRIC METERS FOR INSPECTING SEMICONDUCTORS AND FOR TESTING INTEGRATED CIRCUITS; MAGNETIC METERS NAMELY VOLTMETERS, CHRONOMETERS, DYNAMETERS AND SOUND LEVEL METERS AND VOLTAGE AND AMPERAGE TESTERS AND PROBES FOR TESTING INTEGRATED CIRCUITS; ELECTRON MICROSCOPES

SEMICONDUCTOR TESTERS; ELECTRIC METERS FOR INSPECTING SEMICONDUCTOR AND FOR TESTING INTEGRATED CIRCUITS; MAGNETIC METERS NAMELY VOLTMETERS, CHRONOMETERS, DYNAMETERS AND SOUND LEVEL METERS AND VOLTAGE AND AMPERAGE TESTERS AND PROBES FOR TESTING INTEGRATED CIRCUITS; ELECTRON MICROSCOPES