FEI Electron Optics B.V.

Class 009: Optical apparatus and instruments, namely, electron microscopes; hardware, in particular for microscopic examination; electric and electronic apparatus and instruments, namely, for microscopic examination; microscopes, electron microscopes and scanning electron microscopes; parts and fittings for all the aforesaid goods, namely, sample holders, lenses, lighting devices for microscopes; scientific and laboratory research apparatus, teaching apparatus and simulators, namely, vacuum chambers with precision mechanical stages and electron optical lenses, control software, programs and software applications for the analysis of data generated by the electron-detectors of the microscopes, electron microscopes and scanning electron microscopes; Class 042: Writing, developing and updating of software, software programs and software applications for microscopes, electron microscopes and scanning electron microscopes; writing, developing and updating of software, software programs and software applications for microscopic examination

Laboratory instrument, namely, an electron microscope

Electron microscopes

Remote monitoring and analysis of laboratory instruments for insuring proper functioning; remote monitoring and analysis of laboratory microscopic instruments for insuring proper functioning; remote monitoring and analysis of laboratory microscopic instruments for enabling communication of current availability and performance and for enabling communication of prediction of future availability and performance

Optical apparatus and instruments, namely, electron microscopes; hardware, in particular for microscopic examination; electric and electronic apparatus and instruments, namely, for microscopic examination; microscopes, electron microscopes and scanning electron microscopes; parts and fittings for all the aforesaid goods, namely, sample holders, lenses, lighting devices for microscopes; scientific and laboratory research apparatus, teaching apparatus and simulators, namely, vacuum chambers with precision mechanical stages and electron optical lenses, control software, programs and software applications for the analysis of data generated by the electron-detectors of the microscopes, electron microscopes and scanning electron microscopes; Writing, developing and updating of software, software programs and software applications for microscopes, electron microscopes and scanning electron microscopes; writing, developing and updating of software, software programs and software applications for microscopic examination

Optical apparatus and instruments, namely, electron microscopes; hardware, in particular for microscopic examination; electric and electronic apparatus and instruments, namely, for microscopic examination; microscopes, electron microscopes and scanning electron microscopes; parts and fittings for all the aforesaid goods, namely, sample holders, lenses, lighting devices for microscopes; scientific and laboratory research apparatus, teaching apparatus and simulators, namely, vacuum chambers with precision mechanical stages and electron optical lenses, control software, programs and software applications for the analysis of data generated by the electron-detectors of the microscopes, electron microscopes and scanning electron microscopes; Writing, developing and updating of software, software programs and software applications for microscopes, electron microscopes and scanning electron microscopes; writing, developing and updating of software, software programs and software applications for microscopic examination