FORMFACTOR, INC.

Class 009: Recorded computer software for providing supervisory control and data acquisition (SCADA) of cryogenic systems and equipment; Downloadable computer software for providing supervisory control and data acquisition (SCADA) of cryogenic systems and equipment; Recorded computer software for controlling and monitoring operation, data storage and acquisition, and user access of cryogenic systems and equipment; Downloadable computer software for controlling and monitoring operation, data storage and acquisition, and user access of cryogenic systems and equipment

Class 009: Probes for testing semiconductors; Probes for testing integrated circuits

Probe stations for testing and inspection of semiconductor wafers and semiconductors; testing apparatus for inspecting and testing semiconductor wafers; electrical and optical inspection apparatus for inspection of semiconductor wafers; electric apparatus and instruments for the examination of semiconductor wafers, namely, semiconductor wafer probe station apparatus and instruments

probe stations for testing and inspecting integrated circuits and semiconductor devices; probe heads for testing integrated circuits and semiconductor devices; probe cards for testing integrated circuits and semiconductor devices; probe cards for use in connection with inspection of semiconductor devices and integrated circuits; probes for testing of integrated circuits and semiconductor devices; probes for the measurement of electronic signals; probe cards for inspecting integrated circuits and semiconductor devices; waveguide probes for on-wafer probing of circuits; positioners for probing microelectronic assemblies; testing, inspection and probing apparatus, testing, inspection, and probing instruments, computer hardware, and computer software for use in the process of manufacture, testing, and inspection of semiconductor devices and integrated circuits; optical inspection apparatus for semiconductor devices and integrated circuits; computer software for testing and inspecting integrated circuits; computer software for calibrating probes and probe stations; computer software for use in operating semiconductor and integrated circuit testing machines; testing, inspection and probing instruments for electronic reliability testing of integrated circuits and semiconductor devices

probe stations for testing and inspecting integrated circuits and semiconductor devices; probe heads for testing integrated circuits and semiconductor devices; probe cards for testing integrated circuits and semiconductor devices; probe cards for use in connection with inspection of semiconductor devices and integrated circuits; probes for testing of integrated circuits and semiconductor devices; probes for the measurement of electronic signals; probe cards for inspecting integrated circuits and semiconductor devices; waveguide probes for on-wafer probing of circuits; positioners for probing microelectronic assemblies; testing, inspection and probing apparatus, testing, inspection, and probing instruments, computer hardware, and computer software for use in the process of manufacture, testing, and inspection of semiconductor devices and integrated circuits; optical inspection apparatus for semiconductor devices and integrated circuits; computer software for testing and inspecting integrated circuits; computer software for calibrating probes and probe stations; computer software for use in operating semiconductor and integrated circuit testing machines; testing, inspection and probing instruments for electronic reliability testing of integrated circuits and semiconductor devices

computer software sold as a feature of probe systems for processing, testing, and inspecting semiconductor wafers and integrated circuits; computer software and computer hardware sold as a feature of probe systems for processing, testing, and inspecting semiconductor wafers and integrated circuits; semiconductor testing apparatus with automated control software; probe stations, and their components, software, and accessories, for on-wafer testing of integrated circuits and semiconductors; automated process control systems, namely, computer software and computer hardware used to monitor and automate industrial machinery, namely, probe stations for on-wafer testing of integrated circuits and semiconductors

probes for testing integrated circuits, semiconductors, and RF power devices; probes for the measurement of electronic signals; probes for testing integrated circuits, namely, waveguide probes for on-wafer probing of circuits; "PROBE"

providing technical information about equipment used for the measurement, inspection, and testing of semiconductor wafers, integrated circuits, and chips; providing consulting, support, and partnerships for the installation, maintenance, and troubleshooting in the nature of repair of equipment and devices used for the measurement, inspection, and testing of semiconductor wafers, integrated circuits, and chips; providing information and technical support relating to the installation, compatibility, maintenance, calibration, repair, and service of equipment and devices used for the measurement, inspection, and testing of semiconductor wafers, integrated circuits, and chips; providing consumer product information about equipment used for the measurement, inspection, and testing of semiconductor wafers, integrated circuits, and chips; providing industry expertise and supplier partnerships for the calibration of equipment and devices used for the measurement, inspection, and testing of semiconductor wafers, integrated circuits, and chips

providing a buy-back and trade-in program and online retail shop services, all featuring measurement, inspection, and testing equipment for semiconductor wafers, integrated circuits, and integrated circuit and semiconductor chips; online retail store services featuring the resale of measurement, inspection, and testing equipment for semiconductor wafers, integrated circuits, and integrated circuit and semiconductor chips

probes for testing integrated circuits and semiconductors; probes for the measurement of electronic signals; probes for testing integrated circuits, namely, waveguide probes for on-wafer probing of circuits

probes, probe stations, [ sockets, ] and their components and accessories, for testing integrated circuits; computer software for testing integrated circuits and calibrating probes, probe stations [ and sockets ]

semiconductor test equipment, namely, wafer probe cards

semiconductor test equipment; namely, wafer probe cards

Probes for on-wafer testing of integrated circuits; "PROBE"

wafer probe cards, space transformers, probe heads, printed circuit boards, interposers, and interconnection elements and tips therefor

Semiconductor test equipment, namely, wafer probe cards, space transformers, probe heads, printed circuit boards, interposers, and interconnection elements and tips therefor

Class 009: electronic components; namely, probe cards

electronic components; namely, semiconductor devices, wiring substrates, space transformers, interposers and contact elements and tips therefor

electronic components; namely, interconnects to connect semiconductor devices

probes for on-wafer testing of integrated circuits

Probe cards used for testing integrated circuits

probe station for testing of semiconductors

probes, probe stations, and their components and accessories, for on-wafer testing of integrated circuits

[ Wiring substrates, space transformers, interposers, ] probe cards [ , and contact elements and tip structures therefor ]

Electronic components, namely, interconnects to connect semiconductor devices

ELECTRICAL PROBE FOR ON-WAFER TESTING OF INTEGRATED CIRCUITS; "PROBE"

WIREBONDERS AND ELECTROPLATERS FOR FORMING ELECTRICAL CONTACTS FOR PROBE CARDS, SPACE TRANSFORMERS, SOCKETS, SEMI-CONDUCTORS AND INTEGRATED CIRCUITS

Electronic components and interconnection elements therefor

Electronic components, namely, semiconductors, wiring substrates, space transformers, interposers, probe cards and contact elements and tip structures therefor,

electronic systems comprised of electronic circuits and electronic components, namely, space transformers, interposers, probe elements, and small resilient contact elements and probe cards

electronic system comprised of electronic circuits and electronic components, namely, space tranformers, interposters, probe elements, and small resilient contact elements and probe cards including small resilient contract elements

electronic components, namely, semiconductor devices, wiring substrates, space transformers, interposers, probe cards, and contact elements and tips therefor

electronic components, namely, interconnects to connect semiconductor devices

electronic components, namely, interconnects to connect semiconductor devices

electronic components, namely, interconnects, space transformers, interposers, probe elements, probe cards, contact elements and sockets

computer software for controlling the operation of electronic assembly equipment and instruction manuals provided therewith

electronic components, namely, semi-conductors, wiring substrates, space transformers, interposers, probe cards and contact elements and tip structures therefor

electronic components and interconnection elements therefor; engineering consultation services

electronic components, namely, semi-conductors, wiring substrates, space transformers, interposers, probe cards and contact elements and tip structures therefor

chuck assemblies for supporting probes for electrical testing

self-contained temperature control and probe unit for testing semiconductors

positioner for probing microelectronic assemblies