Class 009: Microscopy and spectroscopy systems comprised of spectrum imaging and composition analysis equipment for use in energy-filtered transmission electron microscopy (EFTEM) and electron energy loss spectroscopy (EELS)
Downloadable software for use in connection with electron microscopes and the field of microscopy devices for acquiring, viewing, analyzing and processing data from the electron microscopes
Electron microscopy equipment, namely, specimen preparation equipment and accessories in the nature of automated and non-automated laboratory equipment for cutting, etching, milling and plasma cleaning of specimens for use with transmission electron microscopy (TEM) equipment and scanning electron microscopy (SEM) equipment; Electron microscopy equipment, namely, specimen holders, stages and transfer stations in the nature of laboratory equipment to be used with electron microscopes for holding and transferring specimens, namely biological and inorganic specimens, for use in cooling, heating, preparing, transferring and examining of the specimens for use in TEM and SEM; Imaging equipment, namely, cameras and non-medical digital imaging devices for use in spectroscopy and electron microscopy analysis; Electron microscopy equipment, namely, non-imaging electron detectors, electron energy loss spectroscopy detectors and energy-filtered TEM, electromagnetic cathodoluminescence detectors to detect photons for use in spectroscopy and electron microscopy analysis; Electron microscopy equipment, namely, in-situ electron microscopy equipment in the nature of microscopes having embedded recorded computer software for electron microscopy data analysis; Recorded computer software for use in the acquisition, processing, analysis and presentation of microscopic imaging data
System for detecting trace elements of samples in an Electron Microscope comprised of Energy Dispersive Spectroscopy (EDS) and Backscattered Electron (BSE) detectors, not for medical purposes
Imaging device for use in electron microscopy, namely, a fully integrated hybrid-pixel electron detector camera with embedded software for data acquisition and processing in advanced electron diffraction studies
Electron microscopy equipment, namely, specimen preparation equipment and accessories in the nature of laboratory equipment for cutting, etching, milling and plasma cleaning of specimens for use with transmission electron microscopy (TEM) equipment and scanning electron microscopy (SEM) equipment; Electron microscopy equipment, namely, specimen holders, stages and transfer stations in the nature of laboratory equipment for use in cooling, heating, preparing, transferring and examining of specimens for use in TEM and SEM; Imaging equipment, namely, cameras and non-medical digital imaging devices for use in spectroscopy and electron microscopy analysis; Electron microscopy equipment, namely, non-imaging electron detectors, electron energy loss spectroscopy detectors and energy-filtered TEM, cathodoluminescence detectors to detect photons for use in spectroscopy and electron microscopy analysis; Electron microscopy equipment, namely, in-situ electron microscopy equipment in the nature of microscopes having embedded computer software for electron microscopy data analysis; recorded computer software for use in the acquisition, processing, analysis and presentation of microscopic imaging data
Imaging filter and direct detection system in the nature of scientific advanced imaging devices for scientific research purposes for use in electron microscopy and electron tomography to perform single particle imaging and study cellular organization and ultrastructure in material and life sciences applications
Microscopy and spectroscopy systems comprised of spectrum imaging and composition analysis equipment for use in energy-filtered transmission electron microscopy (EFTEM) and electron energy loss spectroscopy (EELS)
a scanning transmission electron microscopy (STEM) diffraction system for collecting a four-dimensional (4D) data cube through hardware synchronization with in-situ cameras
a specimen preparation tool, namely, an ion beam generator for generating an ion beam used to prepare a sample suitable for observation and analysis in an electron microscope
microscopy software for targeted imaging to survey a region of interest, namely laboratory software for use in connection with electron microscopy for viewing and analyzing molecules and particles at the atomic scale
Charge-coupled device cameras, known as CCD cameras, and a digital imaging system comprising a scintillator, lens, fiber optic face plate, a CCD detector, computer hardware and software for control of the CCD camera, an electronic readout, and a vacuum interface, for use in electron microscopy
Class 009: A specimen preparation tool, namely, a noble gas ion beam generator for generating a noble gas ion beam used to cut cross-sections of samples suitable for observation and analysis in an electron microscope
Class 009: ion beam specimen preparation system, for etching, coating and cooling specimens, to prepare them for examination by a scanning electron microscope (SEM), and for transferring specimens under vacuum to an SEM specimen stage
Class 009: microtome and digital imaging system, consisting of a microtome, specimen stage, digital control for an electron beam, back-scattered electron detector and computer software for use in controlling the microtome, the position of a specimen and the specimen stage, communicating specifications for magnification, focus, astigmatism and beam blanking to a scanning electron microscope (SEM) column, controlling the position and scanning function of an electron beam, scanning and monitoring images, integrating multiple image frames, coordinating multiple, simultaneous image inputs, controlling the pixel density, pixel dwell time, magnification, focus, aspect ratio and astigmatism of an acquired image; and re-binning image data for export to three dimensional imaging software, all for use with scanning electron microscopes
Charge-coupled device cameras, known as CCD cameras, and a digital imaging system comprising a scintillator, lens, fiber optic face plate, a CCD detector, computer hardware and software for control of the CCD camera, an electronic readout, X-ray shielding and a vacuum interface, for use in electron microscopy
radio frequency-generated gas plasma cleaning chamber for the removal of hydrocarbon contamination from the surface of electron microscope samples and holders; incorporating a port for the deposit of microscope samples and holders, a gas plasma generater and flow controller, a radio frequency (RF) power generator, turbomolecular and multistage diaphragm pumps for vacuuming gas plasma from the cleaning chamber, and computer hardware and software for operation of the cleaning chamber
digital, charge-coupled device cameras [ and television cameras ] for use in electron microscopy; digital camera controllers for use with transmission electron microscope cameras; imaging filters for use with transmission electron microscopes; detectors for use in detecting variations in the deflection of an electron beam off a sample surface, for use in scanning transmission electron microscopy; specimen holders for use with electron microscopes, not for medical use; specimen clamping units sold as integral components of specimen holders for use with electron microscopes, not for medical use; cooled specimen holders, not for medical use, and storage containers for transfer and examination of cryogenically cooled specimens, and digital temperature controllers therefor; cryofixation chambers for use in cryogenically freezing specimens, and tools and transfer containers for use therewith; work stations for use in the transfer and preparation of cryogenically cooled specimens; pump out tools for the transfer of cryogenically cooled specimens; diaphragm and molecular drag pumps for evacuating liquids and gases from specimen holders, creating a vacuum for storage of specimens and testing specimen holders; work stations for use of vacuum pumps; specimen heating holders; specimen cooling holders and stages, anti-contaminator and airlock chambers; low temperature chambers for preparation of specimens and transfer of specimens to a scanning electron microscope; cathodoluminescence imaging systems for the detection and collection of photons emitted from a specimen interacting with an electron beam, consisting of a charge-coupled device camera, collection optics, optical filters, a photomultiplier tube and photodiode, and computer programs for use in collecting, analyzing, archiving and presenting images; digital spectrometers; parallel-detection electron energy-loss spectrometers; energy-filtering electron energy-loss spectrometers optimized for biological electron microscope applications; apparatus for rotating and exchanging laboratory specimens sold as an integral component of an ion milling machine; ion beam coating chambers, for use in preparing specimens for scanning and transmission electron microscopy; ion beam etching and sputter coating chambers for use in preparing specimens for scanning, electron and light microscopy; ion polishers for use in preparation of specimens for transmission electron microscopy; ultrasonic disc cutters for use in cutting wafers from brittle specimens for examination via transmission electron microscopy; apparatus, namely, ion milling machines, for preparing cross sections of specimens for transmission electron microscopy; disc grinders and dimple grinders used to thin and polish brittle specimens, in preparation for examination via microscopy; disc punches used to cut ductile and soft specimens into discs, in preparation for examination via microscopy; electronic apparatus for reducing ambient magnetic fields in environments where scanning electron microscopes and scanning transmission electron microscopes are used; computer software for use in the field of microscopy, namely, computer software for use in the preparation and manipulation of microscopic specimens; computer software for use in microscopic imaging and analysis; computer software for use in the acquisition, processing, analysis and presentation of microscopic image data; computer software for use in tuning transmission electron microscopes; computer software for use in the production of composite images from adjacent images acquired with a charge-coupled device camera; computer software for use in the automatic adjustment of imaging parameters of a transmission electron microscope's focus, stigmation and beam tilt, for high resolution electron microscopy; computer software used to automate analysis of selected area electron diffraction patterns and high-resolution lattice images of crystalline samples; computer software for use in off-axis electron holography; computer software for use in automating graphic interchange format alignment; computer software for controlling and automating the operation of an energy filter and transmission electron microscope combination, and for automating data analysis relating thereto; computer software for use in studying the electrical properties of semiconductor materials and devices via scanning electron microscopy and scanning transmission electron microscopy; equipment for use in conjunction with scanning electron microscopes for studying the electrical properties of semiconductor materials and devices through the application of electron beam induced current, namely, charge-coupled device cameras, current amplifiers, computers and monitors, sample holders, specimen holder exchange tools, stage adaptors to take sample holders, electron beam induced current and beam current signal cables, and test boxes incorporating a low noise current source and photodiode; computer software for use in conjunction with scanning electron microscopes for studying the electrical properties of semiconductor materials and devices through the application of electron beam induced current, namely, computer software for use in signal sampling and controlling the amplifier and electron beam; specimen tensile and heating stages, namely, specimen stages equipped with grips for use in heating and deforming specimens; all of which are used in scientific and medical research
charge-coupled device cameras for use in electron microscopy, in the fields of material science and biology, and not for use in the fields of medical diagnostics, forensic science and fields utilizing electronic light wave analyzers for use in measuring the appearance and reflected color of objects
specimen holders in the nature of a pedestal with one or multiple extending specimen support arms, which either are spring-loaded to engage the specimen, or act as receptacles for a wax securing medium, for use with transmission electron microscopes
computer programs for controlling and automating the operation of an energy filter and transmission electron microscope combination, and for automating data analysis relating thereto
