Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring the physical properties of layers, coating and surfaces, in particular for measuring and/or testing hardness, micro hardness, elasticity modules; computer controlled measuring system for micro hardness testing;[ magneto-, opto-electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] data processors; computers; computer software for use in controlling scientific, electrical, optical, and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results
Class 009: Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring the thickness of layers, in particular by eddy current, [ electromagnetic radiation, magnetic induction and/or coulometric methods, ] instruments for measuring thickness of coatings, alloy composition, material analysis, [ porosity, electrical conductivity, ferrite content, microhardness, ] phase angles, and other properties of coatings and layers; [ magneto-, opto-electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] data processors; computers; computer software for use in controlling scientific, electrical, optical, and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results
Scientific, electrical, optical, monitoring and measuring instruments, namely instruments for measuring the thickness of layers of electromagnetic radiation; optical instruments for measuring the diffraction, refraction, absorption, luminescence, scattering, and reflection phenomena for the determination of layer thickness; coating thickness measurement instruments, electrical conductivity measurement instruments, micro hardness measuring instruments, porosity measuring instruments, instruments for measuring thickness of coatings, alloy composition, material analysis, porosity, electrical conductivity, ferrite content, microhardness, and other properties of coatings and layers; magneto-, opto-electronic data recording media, namely blank magnetic computer tapes and floppy discs; electromagnetic radiation detectors; spectrometers, namely x-ray fluorescence spectrometers; semiconductor detectors; color video camera; X-ray detectors; x-ray tubes for scientific laboratory-purposes; data processors; computers; measuring apparatus and instruments, namely programmable x-y stages, namely computer hardware and computer software for measuring objects; computer software for use in controlling the scientific, electrical, optical, and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results
Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring thickness of coatings, alloy composition, material analysis, [ porosity, electrical conductivity, ferrite content, micro-hardness, ] and other properties of coatings and layers; computers and data processors for use in the aforementioned measuring instruments; [ blank magnetic computer tapes and floppy disks for recording magnetic, optical and electronic data; ] thickness measurement instruments that use [ ultra sound and ] electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and for reflection phenomena to determine the layer of thickness of metal, x-ray detectors; x-ray tubes not for medical purposes; computer software for use in controlling scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process data
Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring thinkness of coatings, alloy composition, material analysis, [ porosity, electrical conductivity, ] content, [ micro-hardness, ] and other properties of coatings and layers; computer and data processors for use in the aforementioned measuring instruments; [ blank magnetic computer tapes and floppy disks for recording magnetic, optical and electronic data; ] thickness measurement instruments that use [ ultra sound and ] electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine to layer of thickness of metal x-ray detectors; x-ray tubes not for medical purposes; computer software for use in controlling scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process data
Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring the thickness of layers by electromagnetic radiation, optical instruments for measuring the diffraction, refraction, absorption, luminescence, scattering, and reflection phenomena for the determination of layer thickness, coating thickness measurement instruments, [ electrical conductivity measurement instrument, micro hardness measuring instruments, porosity measuring instruments, ] instruments for measuring thickness of coatings, alloy composition, material analysis, [ porosity, electrical conductivity, ferrite content, microhardness, and other properties of coatings and layers; magneto-, opto-electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] electromagnetic radiation detectors; spectrometers, namely, X-ray fluorescence spectrometers; semiconductors detectors, color video cameras, X-ray detectors; X-ray tubes for scientific laboratory purposes, data processors; computers; computer software for use in controlling the scientific, electrical, optical, and monitoring parameters of measuring instruments and to analysis and evaluate, transmit and process the results | [ Training in the use and operation of scientific, electrical and optical monitoring and measuring instruments, computers and software used therewith; providing online training via a global computer network in the use and operation of scientific, electrical and optical monitoring and measuring instruments and computers and software used therein ] | [ Product development for others; computer consultation for others; technical consultation in the field of scientific, electrical, optical, monitoring and measuring apparatuses and instruments and computers and software used therein; providing online consultation via a global computer network in the field of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; computer services, namely, designing and implementing web sites for others; Consulting and product development surfaces in the field of upgrading computers and software applications, regarding transmission and reproduction of sound, image, magneto-, opto-, electronic data, layer thickness measuring, x-ray fluorescence, semi-conductivity, electromagnetic radiation and statistical evaluation of data ]
training in the use and operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; providing on-line training via a global computer network in the use an operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; software for use with instruments that use X-rays for measuring layer thicknesses; product development for others; computer software consultation for others; technical consultation in the field of scientific, electrical, optical monitoring and measuring apparatuses and instruments and computers and software used therein; providing on-line consultation via a global computer network in the field of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; computer services, namely, designing and implementing web sites for others
training in the use and operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; providing on-line training via a global computer network in the use and operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, [ electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments, ] instruments for measuring thickness of coatings, alloy composition, material analysis, porosity, [ electrical conductivity, ] ferrite content, micro-harness, and other properties of coatings and layers; [ magneto-, opto,- and electronic data recording media, namely, blank magnetic computer tapes and floppy discs; thickness measurement instruments that use ultra sound ] and electromagnetic radiation for measurement of diffraction refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thicknesses of metal for measurement; x-ray detectors; x-ray tubes not for medical purposes; computer software for use in controlling the scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results; product development for others; computer software consultation for others; technical consultation in the field of scientific, electrical, optical monitoring and measuring apparatuses and instruments and computers and software used therein; providing on-line consultation via a global computer network in the field of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; computer services, namely, designing and implementing web sites for others
[ training in the use and operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein, providing on-line training via a global computer network in the use an operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein ]; Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, [ electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments; ] instruments for measuring thickness of coatings, alloy compositions, material analysis, [ porosity, electrical conductivity, ] ferrite content, [ micro-hardness, ] and other properties of coatings and layers; [ magneto,- opto,- and electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] computers and data processors for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments; thickness measurement instruments that use [ ultra sound and ]electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thicknesses of metal for measurement; x-ray detectors; x-ray tubes not for medical purposes; computer software for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments; [ product development for others, computer software consultation for others, technical consultation in the field of scientific, electrical, optical monitoring and measuring apparatuses and instruments and computers and software used therein, providing on-line consultation via a global computer network in the field of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein, computer services, namely, designing and implementing web sites for others ]
training the use and operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; providing on-line training via a global computer network in the use and operation of scientific, electrical monitoring and measuring instruments and computers and software used therein; Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, [ electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments, ] instruments for measuring thickness of coatings, alloy compositions, material analysis, [ porosity, electrical conductivity, ] ferrite content, [ micro-hardness, ] and other properties of coatings and layers; [ magneto, -opto, -and electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] computers and data processors for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments; [ thickness measurement instruments that use ultra sound ] and electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thicknesses of metal for measurement; X-ray detectors; X-ray tubes not for medical purposes; computer software for use in controlling the scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results; product development for others; computer software consultation for others; technical consultation in the field of scientific, electrical, optical monitoring and measuring apparatuses and instruments and computers and software used therein; providing on-line consultation via a global computer network in the field of software used therein; computer services, namely designing and implementing web sites for others
training in the use and operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; providing on-line training via a global computer network in the use an operation of scientific, electrical monitoring and measuring instruments and computers and software used therein; Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, [electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments,] instruments for measuring thickness of coatings, alloy compositions, material analysis, [porosity, electrical conductivity,] ferrite content, [ micro-hardness,] and other properties of coatings and layers;[ magneto,-opto, -and electronic data recording media, namely, blank magnetic computer tapes and floppy discs;] computers and data processors for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments; [ thickness measurement instruments that use ultra sound] and electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thicknesses of metal for measurement; X-ray detectors; X-ray tubes not for medical purposes; computer software for use in controlling the scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results; [ product development for others; computer software consultation for others; technical consultation in the field of scientific, electrical, optical monitoring and measuring apparatuses and instruments and computers and software used therein; providing on-line consultation via a global computer network in the field of software used therein; computer services, namely, designing and implementing web sites for others ]
training in the use and operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; providing on-line training via a global computer network in the use and operation of scientific, electrical monitoring and measuring instruments and computers and software used therein; Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, [electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments], instruments for measuring thickness of coatings, alloy compositions, material analysis, [porosity, electrical conductivity,] ferrite content, [ micro-hardness,] and other properties of coatings and layers;[ magneto,-opto, -and electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] computers and data processors for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments; thickness measurement instruments that use ultra sound and electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thicknesses of metal for measurement; X-ray detectors; X-ray tubes not for medical purposes; computer software for use in controlling the scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results; product development for others; computer software consultation for others; technical consultation in the field of scientific, electrical, optical monitoring and measuring apparatuses and instruments and computers and software used therein; providing on-line consultation via a global computer network in the field of software used therein; computer services, namely, designing and implementing web sites for others
training in the use and operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; providing on-line training via a global computer network in the use and operation of scientific, electrical monitoring and measuring instruments and computers and software used therein; Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments, instruments for measuring thickness of coatings, alloy compositions, material analysis, porosity, electrical conductivity, ferrite content, micro-hardness, and other properties of coatings and layers; magneto,-opto, -and electronic data recording media, namely blank magnetic computer tapes and floppy discs; computers and data processors for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments; thickness measurement instruments that use ultra sound and electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thicknesses of metal for measurement; X-ray detectors; X-ray tubes not for medical purposes; computer software for use in controlling the scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results; product development for others; computer software consultation for others; technical consultation in the field of scientific, electrical, optical monitoring and measuring apparatuses and instruments and computers and software used therein; providing on-line consultation via a global computer network in the field of software used therein; computer services, namely, designing and implementing web sites for others
Scientific, electrical, optical monitoring and measuring instruments namely, coating thickness measurement instruments,[ electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments;] instruments for measuring thickness of coatings, alloy compositions, material analysis,[ porosity, electrical conductivity,] ferrite content,[ micro-hardness, ]and other properties of coatings and layers;[ magneto,- opto,- and electronic data recording media, namely, blank magnetic computer tapes and floppy discs;]computers and data processors for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments; thicknesses measurement instruments that use[ ultra sound and ]electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thickness of metal for measurement; x-ray detectors; x-ray tubes not for medical purposes; computer software for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments; [Product development for others; computer software consultation for others; technical consultation in the field of scientific, electrical, optical monitoring and measuring apparatuses and instruments and computers and software used therein; providing on-line consultation via a global computer network in the field of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein; computer services, namely, designing and implementing web sites for others]
variable electronic test assemblies with data handling, and sensors and measuring instruments that can be connected to them, for measurement of layer thicknesses in the range of monolayers up to 10 cm by use of magnetic induction methods or eddy current methods or beta-ray back-scattering methods, for measurement of conductivity of nonferrous metals by means of phase angle measurements, with and without use of a temperature sensor, for measurement of copper layer thicknesses in through-platings of circuit boards, and for determination of ferrite content
Programmable Testing and Measuring Instruments-Namely, Electronic Instruments for Non-Destructive Measurement of Layer Thickness, and Non-Destructive Conductivity Measuring Instruments; Electronic Revolution Meters; Cutting Force Meters; Instruments for Measuring the Density of Anodized Aluminum Coatings; Electrolyte Solutions for Coulometric Measuring of Coating Thickness
Electronic Measuring Instruments-Namely, DC Porosity Holiday Testers for Measuring the Properties of Layers Having a Thickness in the Range of 0.1 Micrometers to 4 Decimeters
Scientific Measuring Instruments Used Primarily in Software Programmable Applications-Namely, Coating Thickness, Measuring Instruments, Employing Beta Backscatter, Coulometric, Capacitance, Magnetic Inductive, and Electrical Eddy Current Principles; Instruments to Measure and Test Sealants of Anodic Coatings; High Voltage DC Porosity Testers for Electrically Non-Conductive Coatings; Electrographic Porosity Testers for Electroplated Coatings or Metallic Substrates; Instruments for Measuring the Electrical Conductivity of Non-Ferrous Metals; Instruments for Measuring the Ferrite Content of Austenitic Steel; and Instruments for Measuring Cutting Torques and Forces on Cutting Blades and Tool Bits; [ Electrolyte for Coulometric Measuring Instruments ]
Scientific Measuring Instruments Used Primarily in Laboratory and Industrial Applications-Namely, Meters for Measuring the Thickness of Coatings; Specifically, Magnetic-Inductive Principle Meters, Eddy-Current Principle Meters, Beta Backscatter Principle Meters, and Capacitance Principle Meters; Porosity Test Sets for Coatings and Insulations; Meters for Measuring Electrical Conductivity of Non-Ferrous Metals; Meters for Measuring the Ferrite Content of Austenitic Steel; Cutting Force Measuring Meters for Machine Tools; Sealing Testors Employing Admittance or Dissipation Factors
