JohnsTech International, Corporation

Test fixtures in the nature of testing apparatus for testing printed integrated circuits, and structural parts therefor; contact test pins for testing printed integrated circuit boards, and structural parts therefor; electric sockets for use with integrated circuit testing, and structural parts therefor; housings for printed circuit boards containing electric contacts; semiconductor testing apparatus; Engineering services related to test pins for testing circuit boards and integrated circuit chips; technical advice, information and consultancy in relation to testing integrated circuit chips; design and development of test pins for testing integrated circuit chips

Test fixtures in the nature of testing apparatus for testing printed integrated circuits, and structural parts therefor; contact test pins for testing printed integrated circuit boards, and structural parts therefor; electric sockets for use with integrated circuit testing, and structural parts therefor; housings for printed circuit boards containing electric contacts; semiconductor testing apparatus; Engineering services related to test pins for testing circuit boards and integrated circuit chips; technical advice, information and consultancy in relation to testing integrated circuit chips; design and development of test pins for testing integrated circuit chips

Test fixtures in the nature of testing apparatus for testing printed integrated circuits, and structural parts therefor; contact test pins for testing printed integrated circuit boards, and structural parts therefor; electric sockets for use with integrated circuit testing, and structural parts therefor; housings for printed circuit boards containing electric contacts; semiconductor testing apparatus

Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers, and integrated circuit test sockets, and components thereof; housings for test contacts in an integrated circuit tester, semiconductor testing apparatus; Engineering services related to testing on a probe array for testing integrated circuit chips; technical advice, information and consultancy in relation to testing on a probe array for testing integrated circuit chips; design and development of probe arrays for testing integrated circuit chips

Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers, and integrated circuit test sockets, and components thereof; housings for test contacts in an integrated circuit tester, semiconductor testing apparatus; Engineering services related to testing on a probe array for testing integrated circuit chips; technical advice, information and consultancy in relation to testing on a probe array for testing integrated circuit chips; design and development of probe arrays for testing integrated circuit chips

Engineering services related to testing on a probe array for testing integrated circuit chips; technical advice, information and consultancy in relation to testing on a probe array for testing integrated circuit chips design and development of probe arrays for testing integrated circuit chips

Engineering services related to test pins for testing circuit boards and integrated circuit chips; technical advice, information and consultancy in relation to testing integrated circuit chips; design and development of test pins for testing integrated circuit chips

Engineering services related to test pins for testing circuit boards and integrated circuit chips; technical advice, information and consultancy in relation to testing integrated circuit chips; design and development of test pins for testing integrated circuit chips

Engineering services related to testing on a probe array for testing integrated circuit chips; technical advice, information and consultancy in relation to testing on a probe array for testing integrated circuit chips design and development of probe arrays for testing integrated circuit chips

Engineering services related to testing on a probe array for testing integrated circuit chips; technical advice, information and consultancy in relation to testing on a probe array for testing integrated circuit chips design and development of probe arrays for testing integrated circuit chips

test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers; semiconductor testing apparatus

Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers, and integrated circuit test sockets, and components thereof; housings for test contacts in an integrated circuit tester, semiconductor testing apparatus | Engineering services related to testing on a probe array for testing integrated circuit chips; technical advice, information and consultancy in relation to testing on a probe array for testing integrated circuit chips design and development of probe arrays for testing integrated circuit chips

"TOUCH"

Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers, and integrated circuit test sockets, and components thereof; housings for test contacts in an integrated circuit tester; semiconductor testing apparatus | Engineering services related to testing on a probe array for testing integrated circuit chips; technical advice, information and consultancy in relation to testing on a probe array for testing integrated circuit chips design and development of probe arrays for testing integrated circuit chips

semiconductor testing apparatus; contacts for testing semiconductor devices

semiconductor testing apparatus; contactor housing and alignment plate material used for testing semiconductor devices; test fixtures in the nature of apparatus for testing integrated circuits

Probes for testing integrated circuits; Test pins for testing printed circuit boards

Probes for testing integrated circuits; Test pins for testing printed circuit boards

test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers, and integrated circuit electrical test sockets, and components thereof; housings for apparatus for testing integrated circuits, namely, housing for test contacts in an integrated circuit tester

Probe arrays for testing integrated circuit chips | Engineering services related to testing on a probe array for testing integrated circuit chips; technical advice, information and consultancy in relation to testing on a probe array for testing integrated circuit chips design and development of probe arrays for testing integrated circuit chips

integrated circuit electrical test sockets and components thereof

test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers, and integrated circuit test sockets, and components thereof; housings for test contacts in an integrated circuit tester

Class 009: test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers, and integrated circuit electrical test sockets, and components thereof; housings for apparatus for testing integrated circuits, namely, housing for test contacts in an integrated circuit tester

test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for integrated circuit testers, and integrated circuit electrical test sockets, and components thereof

test fixtures in the nature of apparatus for testing integrated circuits; contact test pins for integrated circuit testers; and integrated circuit electrical test sockets; and components thereof

INTEGRATED CIRCUIT TEST SOCKETS AND COMPONENTS THEREOF

EXPEDITED CATALOG AND ON-LINE ORDERING SERVICES FEATURING ELECTRONIC COMPONENTS

INTEGRATED CIRCUIT TEST SOCKETS AND COMPONENTS THEREOF

INTEGRATED CIRCUIT TEST SOCKETS AND COMPONENTS THEREOF

integrated circuit test sockets and components thereof

integrated circuit test sockets and components thereof

integrated circuit test sockets and components thereof; "BGA"

integrated circuit test sockets and components thereof

integrated circuit test sockets and components thereof

integrated circuit test sockets and components thereof

integrated circuit test sockets and components thereof

integrated circuit test sockets and components thereof; "INTERNATIONAL"