KABUSHIKI KAISHA NIHON MICRONICS

Class 009: Measuring and testing apparatus and machines for electrical testing of semiconductors and circuits; Probe cards for semiconductor testing; Multilayer printed circuit boards; Glass-ceramic multilayer substrates for semiconductor testing; Class 017: Multilayer laminates for printed circuit boards

measuring or testing machines and instruments; inspection or testing apparatus for semiconductor integrated circuit; inspection or testing apparatus for semiconductor substrate; laboratory apparatus and instruments; inspection apparatus for semiconductor wafer; testing apparatus for semiconductor wafer; inspection or testing apparatus of electric characteristic of Semiconductor; inspection or testing apparatus of electric characteristic of semiconductor integrated circuit; Measuring and testing apparatus and machines for testing and inspection of semiconductors and circuits

measuring or testing machines and instruments; laboratory apparatus and instruments; telecommunication machines and apparatus; inspection or testing apparatus of electric characteristic of semiconductor; inspection or testing apparatus of electric characteristic of semiconductor integrated circuit; Semiconductor testing apparatus; semiconductor inspection equipment; Measuring and testing apparatus and machines for testing and inspection of semiconductors and circuits

Class 009: Probe cards for testing integrated circuits and semiconductor devices; probe cards for use in connection with inspection of semiconductor devices and integrated circuits; testing, inspection, and probing instruments, namely, semiconductor testing instruments for making electrical contact with probes to semiconductor devices for use in the process of manufacture, testing, and inspection of semiconductor devices and integrated circuit; probes for testing of integrated circuits and semiconductor devices; probe stations being a positioning apparatus for connecting probes to semiconductor device electrodes for testing and inspecting integrated circuits and semiconductor devices, namely, precision instruments for manipulation and positioning of microscopic objects; probes for scientific purposes for the measurement of electronic signals; electric contacts; electrical instruments, namely, sockets and socket terminal carriers being electrical terminal blocks; Class 037: Repair or maintenance of probe cards for use in connection with inspection of semiconductor devices and integrated circuits; repair or maintenance of probe cards for testing integrated circuits and semiconductor devices

Class 009: probe cards in the nature of semiconductor testing apparatus; apparatus for testing the electrical properties of semiconductors; apparatus for testing the magnetic properties of semiconductors; Integrated circuit measuring jigs for testing integrated circuits; apparatus for testing the performance of liquid crystal display (LCD) panels; inspection jigs for testing the performance of liquid crystal display(LCD) panels; electric contacts for measuring apparatus and instruments; testing apparatus for integrated circuits; structural and replacement parts for testing apparatus for integrated circuits; testing apparatus for organic light-emitting diodes (OLEDs); structural and replacement parts for testing apparatus for organic light-emitting diodes (OLEDs); Class 037: repair or maintenance of probe cards in the nature of semiconductor testing apparatus; repair or maintenance of apparatus for testing the electrical properties of semiconductors; repair or maintenance of apparatus for testing the magnetic properties of semiconductors; repair or maintenance of integrated circuit measuring jigs for testing integrated circuits; repair or maintenance of apparatus for testing the performance of liquid crystal display (LCD) panels; repair or maintenance of testing apparatus for integrated circuits; repair or maintenance of testing apparatus for organic light-emitting diodes (OLEDs)

(Based on 44(e)) (Based on Use in Commerce) Electric contacts; Measuring apparatus, namely, electronic devices for measuring electric current and electromagnetic apparatus used to measure magnetic fields; Probes, namely, probes for testing integrated circuits; integrated circuit sockets in the nature of electrical sockets

Electrical sockets in the nature of integrated circuit sockets; electrical connectors; electrical and electronic components, namely, plugs; probes for testing semiconductors; electric contacts for semiconductor testers; electrical connectors, namely, probe cards for semiconductor testers; probes for testing apparatus for LCD panels; electric contacts for testing apparatus for LCD panels; electrical connectors, namely, probe cards for testing apparatus for LCD panels; probes for measuring electrical characteristics in apparatus and instruments used in testing electrical components, semiconductors, and LCD panels; electric contacts for measuring apparatus and instruments; electrical connectors, namely, probe cards in the nature of electronic interface cards for measuring apparatus and instruments

Instruments for use in electrical testing machines for testing semiconductors; electrical testing machines for testing semiconductors; probes for testing semiconductors; probes for testing integrated circuits; semiconductor testing apparatus; measuring or testing instruments for use in inspection of semiconductors; electrical testing machines for use in inspecting semiconductor substrates; measuring instruments for electric and magnetic materials, namely, electric and magnetic measuring instruments

"QUALITY", "DEVLIVERY", "COST", "COMPLIANCE", "SERVICE", AND "SAFETY"

[ machines for manufacturing solar batteries ] | [ Probe cards for use in inspection of liquid crystal panels; apparatus for measuring the electrical properties of liquid crystal display panels; ] Electric contacts for measuring or testing machines and instruments; [ testing machines for integrated circuits; testing machines for flat panel displays; ] probe cards for use in testing of integrated circuits or flat panel displays; [ batteries, electric; accumulators, electric; batteries and cells; equipment for inspection of electrical characteristics of solar batteries and cells for solar batteries; measuring or testing machines and instruments for use in appearance inspection of wafers for solar batteries and cells for solar batteries; measuring or testing machines and instruments for use in inspection of solar batteries; ] probe cards for use in inspection of semi-conductors; [ probe cards for use in inspection of liquid crystal display panels; ] testing apparatus for testing of electrical characteristics of semi-conductors; semiconductor wafer probers; [ semiconductor testing apparatus comprising a master controller computer and a mass interconnect connector interface for connection to a plurality of test instruments for testing electrical characteristics of semi-conductors and measuring semiconductor integrated circuits; ] liquid crystal display testing equipment, namely, automated optical inspection (AOI) systems comprised of an automated camera and computerized controller connected to the camera, probe units, blade-type probes, film type probes, manual probers for organic light-emitting diodes (OLEDs), and lighting units for light-up testing for OLEDs | Repair and maintenance of electronic machines and apparatus; [ repair and maintenance of telecommunication machines and apparatus; installation, repair and maintenance of solar batteries; installation, maintenance and repair of electric batteries; installation, maintenance and repair of electric accumulators; ] repair and maintenance of probe cards for use in inspection of semi-conductors; [ repair and maintenance of apparatus for inspection of probe cards; ] repair and maintenance of apparatus for inspection of electrical characteristics of semi-conductors; repair and maintenance of apparatus for measuring integrated circuits; [ repair and maintenance of apparatus for inspecting liquid crystal display panels; ] repair and maintenance of measuring and testing machines and instruments [ ; repair and maintenance of electric or magnetic meters and testers ] | [ design and development of computer programs designed to the specifications of others ]

electric or magnetic meters and testers, namely, magnetic strength meters and testers; probe cards for use in testing of liquid crystal panels; electric contacts for measuring or testing machines and instruments; parts for electronic or magnetic measuring or testing of machines and instruments; testing machines for integrated circuits or flat panel displays; probe cards for use in testing of integrated circuits or flat panel displays; batteries, electric; accumulators, electric; batteries and electric cells; equipment for testing of electrical characteristics of solar batteries and cells for solar batteries; measuring or testing machines and instruments for use in appearance inspection of wafers for solar batteries and cells for solar batteries; measuring or testing machines and instruments for use in inspection of solar batteries; apparatus for testing of electrical characteristics of semi-conductors; apparatus for testing of liquid crystal display panels; apparatus for measuring semiconductor integrated circuits; apparatus for measuring the electrical properties of liquid crystal display panels; probe cards for use in testing of semi-conductors; apparatus for testing of probe cards; Machines and apparatus for repairing or fixing apparatus for manufacturing solar batteries; apparatus for manufacturing solar batteries; Repair or maintenance of measuring and testing machines and instruments; repair or maintenance of electronic machines and apparatus; repair or maintenance of telecommunication machines and apparatus; installation, repair or maintenance of solar batteries; installation, maintenance and repair of electric batteries; installation, maintenance and repair of electric accumulators; repair or maintenance of apparatus for inspection of electrical characteristics of semiconductors; repair or maintenance of apparatuses for inspecting liquid crystal display panels; repair or maintenance of apparatus for measuring integrated circuits; repair or maintenance of apparatus for measuring liquid crystal display panels; repair or maintenance of electric and magnetic measuring machines and instruments; repair or maintenance of probe cards for use in inspection of semi-conductors; repair or maintenance of probe cards for use in inspection of liquid crystal display panels; repair or maintenance of apparatuses for inspection of probe cards; Computer software design, computer programming, or maintenance of computer software; design and development of computer programs designed to the specifications of others

Repair and maintenance of probe cards for use in inspection of semi-conductors

Electric connections; [ Electric couplings; ] Electric contacts; Detectors, namely, electric and magnetic measuring instruments; Diagnostic apparatus, not for medical purposes, namely, circuit testers; [ Electrical connection boxes; ] Measuring apparatuses, namely, electric and magnetic measuring machines; [ Electric measuring devices, namely, clamp meters for measuring electricity; ] Electric connections, namely, plugs, sockets and other contacts; Probes for scientific purposes, namely, probes for testing integrated circuits; Electricity terminals, namely, fixtures for measuring integral circuits; Testing apparatus not for medical purposes, namely, apparatuses for inspection of electrical characteristics; IC sockets in the nature of electrical sockets [ ; Probe Cards in the nature of electronic circuit cards ]

Class 009: Probe cards for use in connection with inspection of semiconductors and liquid crystal display panels