LayTec Aktiengesellschaft

Downloadable software for aggregating and combining measurement parameters of semiconductor wafers in the production of semiconductor devices; Downloadable software for analysing and interpreting in-situ and in-line measurement parameters before, during and after thin film deposition, thin film etching and other treatment and characterisation steps; Downloadable software for improving the yield and the stability of production processes and their analysis results for statistical process control in the production of semiconductor devices; METROLOGY

Optical sensors; electronic devices and equipment for measuring and characterising physical parameters of semiconductor wafers and other thin-film samples in the manufacture of electronic and optoelectronic components.

Software to analyze and interpret in-situ and in-line measurement parameters before, during and after thin layer deposition; software to control process deviations during thin layer deposition; software to improve yield and stability of production processes by correlating multi-measurement parameters and their analysis results for the statistical process control

Optical sensors; electronic devices and plants assembled thereof for measuring physical parameters; electronic devices and plants assembled thereof for measuring, monitoring and controlling the layer growth during the manufacture of semiconductor devices; software for recording and analyzing data from optical sensors, electronic devices and plants assembled thereof, during the semiconductor manufacturing process

[Optical sensors; electronic devices and plants assembled thereof for measuring physical parameters and for measuring, monitoring and controlling the layer growth during the manufacture of semiconductor devices; ]Software for measuring physical parameters and for measuring, monitoring and controlling the layer growth during the manufacture of semiconductor devices

Optical sensors for monitoring and controlling the layer growth during the manufacture of optoelectronic components, namely, light emitting diodes, laser diodes, photo diodes, transistors, integrated circuits, solar cells and semiconductors; devices and plants for measuring physical parameters during the manufacture of optoelectronic components, namely, optical sensors for measuring substrate bowing, growth rate, surface morphology, optical constants, temperature, reflectance, rotation speed and film composition; computer software for measuring, monitoring and controlling the manufacture of optoelectronic components