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workpiece positioning system for use in machining of objects, comprising a motor-driven rotating apparatus for gripping and rotating the workpiece about a rotary axis and a motor-driven carriage for supporting the rotating apparatus and moving it along the rotary axis
Entertainment services, namely, providing amusement centers, video arcade games and facilities for computerized interactive laser action games; conducting parties and corporate events; Educational services, namely, conducting training and conferences in the field of computerized interactive laser action games
a scope alignment system for firearms in the nature of gun scopes; a rifle scope alignment system in the nature of gun scopes; a scope alignment system for aligning scope stadia with the center line of a firearm's action in the nature of gun scopes; a rifle scope alignment system for aligning rifle scope stadia with the center line of the rifle's action in the nature of gun scopes
Clothesline; Hammocks; Animal hair; Canvas bags for storage of food, grain; Cloth bags for storage; Clothes pin storage bags; Fishing nets; Mountaineering ropes; Packing rope; Packing materials, not of rubber, plastics, paper or cardboard; Rope ladders; Shoe bags for storage; Snare nets; Tow ropes for automobiles; Unfitted vehicle covers
Medicated facial wound care spray for use in moistening, cleaning and treating wounds and burns to the skin resulting from laser skin resurfacing, surgical procedures, skin peels and radiation
Reagents; fluorescent dyes, fluorescent nucleotides and fluorescent oligonucleotides having nucleic sequencing reagents all used for scientific and/or research | Reagents; diagnostic reagents for clinical or medical laboratory use; medical diagnostic reagents; clinical medical reagents
Compressed speciality gases and liquids, namely, high purity gases and liquids, gas and liquid mixtures, protocol gases, and laboratory gases, for medical uses; Compressed speciality gases and liquids, namely, high purity gases and liquids, gas and liquid mixtures, protocol gases, and laboratory gases, for industrial uses
Batteries; Cameras; Earphones; Eyeglasses; Blank USB flash drives; Car video recorders; Cases for smartphones; Chargers for batteries; Chargers for smartphones; Computer equipment, namely, wireless cards; Computer keyboards; Computer mouse; Computer peripherals; Computer printers for printing documents; Dust protective goggles and masks; Electric charging cables; Electrical adapters; Electronic apparatus, namely, electronic display boards, plasma display boards, electronic display screens; Eyeglass cases; GPS navigation device; Mouse pads; PC tablets; Power supply connectors and adaptors for use with portable electronic devices; Safety goggles; Selfie sticks; Smart watches; Solar batteries; Stands for personal digital electronic devices, namely, cell phones, MP3 players, personal digital assistants; Thermometers not for medical purposes; Tripods for cameras; USB cables; Wireless computer mice; Wireless electronic scales; Wireless headsets for smartphones
Ornaments for Christmas trees, except lights, candles and confectionery; Trading card game equipment accessories, namely, trading card game tokens, trading card game life counters, and trading card trays for rolling dice; Tabletop card gaming equipment accessories, namely, tabletop card game tokens, tabletop card game life counters, and tabletop card trays for rolling dice
Defect repairing machines for photomasks for semiconductors; defect repairing machines for reticles for semiconductors; defect repairing machines for wafers for semiconductors; defect repairing machines for photomasks for flat panel displays; defect repairing machines for photomask blanks for flat panel displays | Semiconductor photomask optical inspection apparatus; analyzing apparatus, namely, optical inspection apparatus for defect of photomasks for semiconductors; semiconductor photomask pattern optical inspection apparatus; semiconductor photomask pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor photomask pattern; semiconductor photomask imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor photomask; semiconductor photomask phase-shift measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for measurement of semiconductor photomask phase-shift; semiconductor photomask transmittance measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for measurement of semiconductor photomask transmittance; apparatus and instruments for measuring semiconductor photomask phase shifting amount, namely, optical measurement system comprised of optical inspection apparatus for measurement of semiconductor photomask phase shifting amount; semiconductor reticle optical inspection apparatus; analyzing apparatus, namely, optical inspection apparatus for defect of semiconductor reticles; semiconductor reticle pattern optical inspection apparatus; semiconductor reticle pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor reticle pattern; semiconductor reticle imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor reticle; semiconductor wafer optical inspection apparatus; semiconductor wafer measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor wafer; semiconductor wafer imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor wafer; semiconductor wafer edge optical inspection apparatus; analyzing apparatus, namely, optical inspection apparatus for defect of wafers for semiconductors; semiconductor photomask blanks optical inspection apparatus; semiconductor photomask blanks imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor photomask blanks; optical inspection apparatus for defect of flat panel display photomasks; optical inspection apparatus for defect of flat panel display photomask pattern; flat panel display photomask pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on flat panel display photomask pattern; optical inspection apparatus for defect of flat panel display photomask blanks; pellicle optical inspection apparatus for photomasks for flat panel displays; pellicle mounting apparatus, namely, optical inspection apparatus with the capability of mounting pellicles on photomasks for flat panel displays; confocal microscopes; laser microscopes; computer peripheral devices; optical inspection systems for in-suit visualizing of electro-chemical reactions comprising optical inspection apparatus for semi-conductor materials and elements; semi-conductor testing machines and instruments; electron microscopes; semiconductor defect detectors; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision crystallographic measuring apparatus; data sets, downloadable, in the field of semiconductors; computer software, recorded, for operating semiconductor photomask, reticle or pellicle optical inspection apparatus; computer software applications, downloadable, for operating semiconductor photomask, reticle or pellicle optical inspection apparatus; computer hardware; computer programs, downloadable, for operating semiconductor photomask, reticle or pellicle optical inspection apparatus
Confocal scanning microscopes; optical inspection apparatus for industrial use for inspection of semiconductor materials, namely, photomasks and reticles silicon wafers and mask blanks in the nature of blank optical plate; phase-shift mask measurement system for photomask comprising optical measurement unit in the nature of optical measuring sensors, mask stages in the nature of optical stages for reflection and transmission measurements of flat substrates, electronic controller and computer; wafer inspection system comprised of optical inspection apparatus, wafer stages in the nature of stages for semiconductor wafers, electronic controller, and computer; wafer measurement system comprised of optical measurement apparatus, wafer stages in the nature of stages for semiconductor wafers, electronic controller and computer; substrate inspection system comprised of optical inspection apparatus, substrate stage in the nature of optical stages for reflection measurement of flat substrates, electronic controller, and computer; PV cell measurement system comprised of solar simulator, measurement unit in the nature of electronic sensors for measuring solar radiation, cell stages in the nature of stages for measurement of flat substrates, electronic controller and computer; coating thickness scanning system for lithium ion batteries comprised of coating thickness measuring gauge ; pellicle inspection apparatus in the nature of an optical inspection apparatus that inspects a pellicle film of a mask provided with a pellicle and used in EUV lithography
tires; motorcycle tires [ ; pneumatic and solid tires for land vehicles; wheels for land vehicles; inner tubes for vehicle tires; wheel rims; and parts and fittings for all of the afore said goods, namely, valves, rim bands, and sponge rubber rings ]
Defect repairing machines for photomasks for semiconductors; defect repairing machines for reticles for semiconductors; defect repairing machines for wafers for semiconductors; defect repairing machines for photomasks for flat panel displays; defect repairing machines for photomask blanks for flat panel displays | Semiconductor photomask optical inspection apparatus; analyzing apparatus, namely, optical inspection apparatus for defect of photomasks for semiconductors; semiconductor photomask pattern optical inspection apparatus; semiconductor photomask pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor photomask pattern; semiconductor photomask imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor photomask; semiconductor photomask phase-shift measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for measurement of semiconductor photomask phase-shift; semiconductor photomask transmittance measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for measurement of semiconductor photomask transmittance; apparatus and instruments for measuring semiconductor photomask phase shifting amount, namely, optical measurement system comprised of optical inspection apparatus for measurement of semiconductor photomask phase shifting amount; semiconductor reticle optical inspection apparatus; analyzing apparatus, namely, optical inspection apparatus for defect of semiconductor reticles; semiconductor reticle pattern optical inspection apparatus; semiconductor reticle pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor reticle pattern; semiconductor reticle imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor reticle; semiconductor wafer optical inspection apparatus; semiconductor wafer measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor wafer; semiconductor wafer imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor wafer; semiconductor wafer edge optical inspection apparatus; analyzing apparatus, namely, optical inspection apparatus for defect of wafers for semiconductors; semiconductor photomask blanks optical inspection apparatus; semiconductor photomask blanks imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor photomask blanks; optical inspection apparatus for defect of flat panel display photomasks; optical inspection apparatus for defect of flat panel display photomask pattern; flat panel display photomask pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on flat panel display photomask pattern; optical inspection apparatus for defect of flat panel display photomask blanks; pellicle optical inspection apparatus for photomasks for flat panel displays; pellicle mounting apparatus, namely, optical inspection apparatus with the capability of mounting pellicles on photomasks for flat panel displays; confocal microscopes; laser microscopes; computer peripheral devices; optical inspection systems for in-suit visualizing of electro-chemical reactions comprising optical inspection apparatus for semi-conductor materials and elements; semi-conductor testing machines and instruments; electron microscopes; semiconductor defect detectors; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision crystallographic measuring apparatus; data sets, downloadable, in the field of semiconductors; computer software, recorded, for operating semiconductor photomask, reticle or pellicle optical inspection apparatus; computer software applications, downloadable, for operating semiconductor photomask, reticle or pellicle optical inspection apparatus; computer hardware; computer programs, downloadable, for operating semiconductor photomask, reticle or pellicle optical inspection apparatus
Class 040: MATERIALS TREATMENT, NAMELY, APPLYING A WELD OVERLAY LASER CLADDING ON NAMELY, PISTON RODS, HYDRAULIC AND PNEUMATIC CYLINDERS AND COLUMNS TO PREVENT WEAR AND CORROSION
inspection devices for locating and tracking gaming chips; electronic authenticity checking devices for gaming chips; electric lighting equipment for inspecting gaming chips; electric light sources for inspecting gaming chips; laser pointers for inspecting gaming chips; electronic testing devices for ascertaining the material composition of gaming chips; electronic pigment testing devices for gaming chips; electronic devices for scanning amount and quantity of gaming chips; electronic ID confirmation devices for gaming chips; Light emitting diodes (LEDs) emitting invisible light; laser pointers emitting invisible light; electronic inspection devices for gaming chips with lights emitting invisible light; penlights for inspecting gaming chips; penlights emitting invisible light for inspecting gaming chips | Gaming chips; gaming chips with pigments that emit light in invisible light as a material; gaming chips with pigments that emit light under ultraviolet rays as a material; gaming chips with infrared emitting pigments as a material; gaming chips with ultraviolet security pigments as a material; gaming chips with infrared security pigments as a material; gaming chips with invisible security pigments as a material
Laser systems, not for medical use, comprising lasers, power supplies, and parts; Lasers for scientific purposes, namely, analysis of materials, elements, soil, geological, geochemical, waste product, and food safety; Scientific laser equipment for detection and traceability of materials, elements, soil, geological, geochemical, and waste product
Computer hardware, computer software and instrumentation for use in the field of materials testing, product testing and manufacturing quality control; imaging apparatus for laser-based ultrasound non-destructive testing for the purpose of quality control and inspection of materials and structures during their use or manufacture; analytical equipment primarily comprising lasers, interferometers, optical filters, ultrasound receivers, computer hardware and computer software for testing, detecting, measuring, and evaluating materials, products and manufacturing quality control; computer software for interpreting, evaluating, and visualizing data in the field of materials testing, product testing and manufacturing quality control
Providing online non-downloadable electronic publications in the nature of e-books, e-magazines, and e-brochures in the field of research and consultancy on software, developer experience, user experience, customer experience, DevOps, and technology for enhancing operations and improving both individual and organizational performance; Downloadable electronic books in the field of technology, software, Developer Experience, User Experience, Customer Experience, DevOps, operations, and both individual and organizational performance; Business consulting services in the field of research, software, Developer Experience, User Experience, Customer Experience, DevOps, and technology for enhancing operations and improving both individual and organizational performance; Providing consumer product information relating to software focused on optimizing individual and organizational performance; Providing business advisory services in the field of customer experience and business operations, focused on optimizing individual and organizational performance
Industrial cleansing and polishing preparations for cleaning, treating and polishing metal surfaces other than floors; Industrial metal polishing and cleaning preparations
