METRASPEC Trademark
METRASPEC is a USPTO trademark filed by Nanometrics Incorporated. Status: Abandoned.
Trademark Facts
| Mark | METRASPEC |
|---|---|
| Serial Number | 75542214 |
| Status | Abandoned |
| Filing Date | 1998-08-25 |
| Mark Type | Word |
| Nice Classes | 009 (Electronics & Software) |
| Owner | Nanometrics Incorporated |
| Attorney of Record | BRIAN FLYNN |
| Prosecution Events | 8 |
| Latest Event | ABN6 on 2000-07-24 |
Goods & Services
scientific measuring instrument used to measure critical dimensions, lithography overlay registration, film thickness, and analysis of film composition during microelectronics manufacturing such as the production of integrated circuits