NANOOCS Trademark
NANOOCS is a USPTO trademark filed by Nanometrics Incorporated. Status: Abandoned.
Trademark Facts
| Mark | NANOOCS |
|---|---|
| Serial Number | 76391052 |
| Status | Abandoned |
| Filing Date | 2002-04-02 |
| Mark Type | Word |
| Nice Classes | 009 (Electronics & Software) |
| Owner | Nanometrics Incorporated |
| Prosecution Events | 9 |
| Latest Event | ABN6 on 2003-10-01 |
Goods & Services
Overlay optical metrology systems comprised of measurement optics, wafer handling mechanisms and system control hardware and software for measuring the difference between two nearly coincident patterns on a sample, such as a semiconductor wafer, which patterns are formed by a process such as photolithography, and which patterns are overlaid, one on top of the other and the overlay difference or error may be fed back to the exposure system that created the patterns so that this difference may be corrected on future exposures