GleanMark

FORMALDOUBLEPASS Trademark

FORMALDOUBLEPASS is a USPTO trademark filed by Onespin Solutions GmbH. Status: Cancelled.

Trademark Facts

MarkFORMALDOUBLEPASS
Serial Number79026389
Registration Number3440846
StatusCancelled
Filing Date2006-03-21
Registration Date2008-06-03
Mark TypeStylized
Nice Classes009 (Electronics & Software), 041 (Education & Entertainment), 042 (Software & IT)
OwnerOnespin Solutions GmbH
Attorney of RecordTIMOTHY R. DEWITT
Prosecution Events39
Latest EventDOCKD on 2016-11-04

Goods & Services

Class 009: Scientific, measuring, signaling, checking, supervision computer hardware for use in the field of semiconductor design; implementation, verification or production; computer hardware for conducting, switching, transforming, accumulating, regulating or controlling electricity in the semiconductor area; computer hardware for processing data; computer hardware and software for use in the field of semiconductor design, implementation, verification of integrated circuits or production; computer verification and test purposes, namely, testers, emulators, accelerators, FPGA-boards in the field of semiconductor production; computer software for the functional verification of integrated circuits; Class 041: Providing, arranging and conducting of workshops, conferences, seminars, training courses and educational services, namely, coaching and training-on-the-job, in the field of semiconductor design, implementation, verification or production; Class 042: Scientific and technological research, applications, designs and programming services relating to design, implementation, verification and production of integrated circuits and related software; design and development of computer hardware and software for others; development of software to verify or validate chip designs; licensing of computer software; providing of computer software technical support services, namely, troubleshooting of computer hardware and software problems; Design and development of software for designing, verification and testing of semiconductors

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