PIXIRAD Trademark
PIXIRAD is a USPTO trademark filed by Malvern Panalytical B.V.. Status: Registered.
Trademark Facts
| Mark | PIXIRAD |
|---|---|
| Serial Number | 79273398 |
| Registration Number | 6155788 |
| Status | Registered |
| Filing Date | 2019-09-30 |
| Registration Date | 2020-09-22 |
| Mark Type | Word |
| Nice Classes | 009 (Electronics & Software) |
| Owner | Malvern Panalytical B.V. |
| Attorney of Record | Matthew A. Homyk |
| Prosecution Events | 23 |
| Latest Event | REM3 on 2025-09-22 |
Goods & Services
Scientific, measuring and detecting apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers, neutron activation analysers, pulsed fast and thermal neutron activation analysers; X-ray detecting apparatus and instruments; X-ray measuring, detecting and monitoring instruments, indicators and controllers not for medical purposes; X-ray detectors not for medical purposes; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, namely, X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, X-ray fluorescence spectrometers, wafer analysers, X-ray tubes; materials characterization apparatus in the nature of scientific and measuring apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers; X-ray apparatus not for medical use; analytical, process control and measuring apparatus, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; analytical, process control and measuring apparatus, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for the cement, steel, aluminium, petrochemicals, industrial minerals, glass and polymers industry, and to customers in research and development institutions; metrology tools, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for both silicon and compound semiconductor applications; X-ray fluorescence wafer and disc analysers, and automated ellipsometers; X-ray fluorescence wafer and disc analysers and automated ellipsometers for the silicon semiconductor industry, for analysing film thickness, composition and density; diffraction apparatus for microscopy; diffraction apparatus and instruments; X-ray diffraction instruments, including X-ray diffraction meters for the compound semiconductor industry; X-ray tubes, not for medical purposes; downloadable or recorded computer software for use in relation to spectrometry; downloadable or recorded computer software for analysis purposes; downloadable or recorded computer software for use in relation to diffractometry; downloadable or recorded computer software for use in relation to X-ray fluorescence analysis; downloadable or recorded computer software for use in relation to the determination of X-ray intensities; downloadable or recorded computer software for use in relation to X-ray diffraction analysis for use with x-ray apparatus not for medical use; component parts and fittings for all the aforesaid goods