SMART M-PACKAGE FOR ROBONANO Trademark
SMART M-PACKAGE FOR ROBONANO is a USPTO trademark filed by FANUC CORPORATION. Status: Registered.
Prosecution Summary
Trademark Summary
SMART M-PACKAGE FOR ROBONANO is a word mark covering products including metalworking machine tools; plastic processing machines; metalworking machines, namely machining centers; and machines for precision processing for materials including metals, plastics, stones, glass, sapphires, gemstones, silicon, ceramics, and electronic components. It also includes computers and computer peripherals, downloadable computer software for controlling on-machine measurement devices and machines in manufacturing operations, and measuring instruments (including 3D optical profilers, coordinate measuring instruments, 3D profilometers, and surface profilers), as well as microscopes and electron microscopes. The mark is currently registered (registration date
Trademark Facts
| Mark | SMART M-PACKAGE FOR ROBONANO |
|---|---|
| Serial Number | 79288102 |
| Registration Number | 6624172 |
| Status | Registered |
| Filing Date | 2020-04-20 |
| Registration Date | 2022-01-25 |
| Mark Type | Word |
| Nice Classes | 007 (Machinery), 009 (Electronics & Software) |
| Owner | FANUC CORPORATION |
| Attorney of Record | George W. Lewis |
| Prosecution Events | 39 |
| Latest Event | FINO on 2022-07-25 |
Goods & Services
Class 007: Metalworking machine tools; Plastic processing machines; Metalworking machines, namely, machining centers; Machines for precision processing known as turning of metals, plastics, stones, glass, sapphires, gemstones, silicon, ceramics and electronic components; Stone working machines; Stone cutting machines; Glass-working machines; Sapphire and gemstone working machines; Silicon processing machines; Ceramic processing machines; Machines for processing electronic components; Class 009: Computers; Computer peripherals; Downloadable computer software for controlling on-machine measurement devices in the field of manufacturing operations; Downloadable computer software for controlling machines; Measuring instruments, namely, three-dimensional (3D) optical profilers; Measuring apparatus, namely, coordinate measuring instruments; Measuring instruments, namely, three-dimensional (3D) profilometers; Measuring instruments, namely, surface profilers; Microscopes; Electron microscopes