BRIGHTEST Trademark
BRIGHTEST is a USPTO trademark filed by BRIGHTEST TECHNOLOGY TAIWAN CO., LTD.. Status: Pending.
Trademark Facts
| Mark | BRIGHTEST |
|---|---|
| Serial Number | 98796611 |
| Status | Pending |
| Filing Date | 2024-10-11 |
| Mark Type | Stylized |
| Nice Classes | 009 (Electronics & Software), 042 (Software & IT) |
| Owner | BRIGHTEST TECHNOLOGY TAIWAN CO., LTD. |
| Attorney of Record | Andrew T. Rissler |
| Prosecution Events | 18 |
| Latest Event | EXRA on 2025-12-06 |
Goods & Services
Computers; downloadable computer programs for monitoring and analyzing optical inspection workflows in semiconductor wafer inspection; recorded computer programs for image acquisition, focus calibration, and defect signal processing in semiconductor optical inspection systems; computer operating programs, recorded; downloadable computer software for defect recognition, critical dimension measurement, and pattern overlay analysis; downloadable computer software applications for configuring optical parameters and real-time system control, synchronization, and diagnostics in inspection systems; apparatus for physics, namely, vacuum-compatible optical sensors and beam diagnostics modules used in advanced process nodes in semiconductors; instruments for physics, namely, spectrometers, photon detectors, and image sensors for nanometer-scale defect detection; optical mirrors; optical glasses; computer workstation comprising of processing units, memory, high-speed data buses, optical sensor interfaces, and wafer inspection system control; image transfer apparatus, namely, optical relay modules for transferring inspection images from the lens to a sensor; wafers for integrated circuits; semiconductor devices; semiconductors; IC substrates, namely, plates used in advanced photomask and inspection tooling; precision measuring apparatus, namely, optical-based measurement modules for defect inspection; ultraviolet detectors; automatic optical detectors for detecting phase-shift patterns, sub-resolution bridging, and particulate contamination on semiconductor wafers; apparatus for physics, namely, sensors for determining wafer alignment, position, orientation, and defect inspection; instruments for physics, namely, silicon photodiode detectors and stage sensors; optical sensors; Consultancy in the design and development of computer hardware; computer programming services for data processing; software engineering services for data processing; providing scientific research and development in the field of optical inspection and defect detection; industrial analysis and research services in the field of semiconductor optical inspection for advanced process nodes; research and development of new products for others