GleanMark

PUROVIEW Trademark

PUROVIEW is a USPTO trademark filed by Brooks Automation US, LLC. Status: Pending.

Trademark Facts

MarkPUROVIEW
Serial Number98886360
StatusPending
Filing Date2024-12-05
Mark TypeWord
Nice Classes007 (Machinery), 009 (Electronics & Software), 042 (Software & IT)
OwnerBrooks Automation US, LLC
Attorney of RecordChristopher K Albert
Prosecution Events17
Latest EventEXRA on 2026-01-21

Goods & Services

Downloadable and recorded software for optimizing cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing; Downloadable and recorded software for optimizing contamination control in semiconductor device manufacturing; Downloadable and recorded software for controlling machines for contamination control and cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing; Downloadable and recorded software for use in connection with machines for contamination control in semiconductor device manufacturing; Downloadable and recorded software for use in semiconductor device manufacturing; Downloadable and recorded software for analyzing data related to contamination control and cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing; Machines for contamination control in semiconductor device manufacturing with integrated recorded software for optimizing contamination control, sold as a unit; Machines for contamination control in semiconductor device manufacturing with integrated recorded software for controlling the machines, sold as a unit; Machines for cleaning wafer carriers; Machines for semiconductor device manufacturing with integrated recorded operating system software, sold as a unit; Filters and purifiers for machines, namely, filters and purifiers for removing contaminants from gases used in the semiconductor industry; Semiconductor wafer processing machines using sensors to detect impurities, defects and/or contamination in wafer carriers or wafer carrier systems; Machines for cleaning reticle carriers; Semiconductor substrate manufacturing machines; Machines for contamination control in semiconductor device manufacturing; Machines for cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing with integrated recorded software for optimizing cleaning of wafer carriers and reticle carriers, sold as a unit; Semiconductor wafer processing machines; Machines for inspecting reticle carriers; Semiconductor manufacturing machines; Machines for contamination control in semiconductor device manufacturing with integrated recorded software for analyzing data, sold as a unit; Semiconductor reticle processing machines; Machines for manufacturing semiconductors; Machines for semiconductor device manufacturing; Machines for inspecting wafer carriers; Semiconductor reticle processing machines using sensor systems to detect impurities, defects and/or contamination in reticle carriers or systems; Providing on-line non-downloadable software for analyzing data related to contamination control and cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing; Providing on-line non-downloadable software for optimizing cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing; Providing on-line non-downloadable software for optimizing contamination control in semiconductor device manufacturing; Providing on-line non-downloadable software for use in connection with machines for contamination control in semiconductor device manufacturing; Providing on-line non-downloadable software for use in semiconductor device manufacturing; Providing on-line non-downloadable software for controlling machines for contamination control and cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing

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