Apparatus, instruments and software for scanning probe microscopy being microscopes and downloadable software for use in operating microscopes; microscopes; apparatus, devices and software for surface scanning, capture, measurement and analysis of 3D and nanoscale structures, and 3D and conductive measurements of sub-nanometer surface features being microscopes and downloadable software for use in operating microscopes; structural and replacement parts and fittings for the aforesaid microscopes; Scientific and technological services relating to scanning probe microscopy services being scientific and technological research in the field of microscopy; science and technology services, namely, surface scanning, capture and measurement of 3D and nanoscale structures, and 3D and conductive measurements of sub-nanometer surface features being scientific and technological research in the field of microscopy and semiconductor manufacturing; software as a service (SaaS) services featuring software for use in operating microscopes; technical data analysis relating to scanning probe microscopy for scientific research purposes
