KLA CORPORATION

Class 009: Computer software; computer software algorithms for semiconductor metrology and inspection; computer software for performing measurements of critical dimensions, and feature registration of semiconductor wafers and structures; computer software for use in optical and electron beam metrology systems; computer software provided as part of an integrated software suite for semiconductor manufacturing process control and analysis.

Class 009: Metrology apparatus for semiconductor manufacturing, namely, in-situ units for measuring thin film stress on semiconductor wafers during transport into and out of process chambers of physical vapor deposition (PVD) and chemical vapor deposition (CVD) tools; downloadable and recorded computer software for controlling, operating, and analyzing measurements from such metrology apparatus.

Class 009: Computer software for use in semiconductor manufacturing, namely, software for displaying customizable dashboards as local web applications for lithography engineers and operators; software for collecting, analyzing, and visualizing lithography process data; software featuring artificial intelligence for anomaly detection, prioritization, and automated analysis of semiconductor fabrication data; software enabling unattended drilldown on high-priority anomalies and providing analysis results; software for ad-hoc analysis via graphical user interfaces and conversational user interfaces based on large language models

Class 009: Downloadable and recorded computer software; application software; middleware; and application programming interfaces (APIs) for laboratory automation, namely for enabling connectivity and data exchange between nanoindentation instruments and automated laboratory systems; software for programmatic control of scientific instruments; software for workflow orchestration across laboratory automation platforms and robotics; software for interfacing with Laboratory Information Management Systems (LIMS); software for device compatibility and systems integration within laboratory environments

Class 009: Wireless wafers for measuring physical conditions such as temperature, pressure, vibration, humidity, gas concentration, and electromagnetic properties within semiconductor processing equipment or environments where wafer-like objects are spun, carried, chucked, or handled by the semiconductor processing equipment; Electronic sensors embedded in wafer-like substrates for monitoring operational parameters of semiconductor processing tools, including thermal, mechanical, and environmental conditions; Data acquisition wafers featuring wireless communication modules for transmitting measurement data from semiconductor processing environments to external monitoring systems

Class 009: Downloadable software applications and modules featuring generative artificial intelligence, machine learning, and deep learning for use in data analysis, predictive modeling, and automated decision-making

Class 009: Hardware and software for operating and charging metrology equipment in semiconductor processing environments; load ports; electronic equipment including front-opening unified pods (FOUPs); software for communication between load ports and wafer sensors

Class 009: Computer software that utilizes various model-based and model-less machine learning approaches to provide thickness, critical dimensions, material properties, and other key measurements based on raw signals collected from optical and X-ray metrology tools to enable on-demand, manual, and automatic recipe tuning, recipe import and export, and recipe database management

Laser scanning semiconductor inspection systems; electronic apparatus for detecting defects on patterned semiconductor wafers; optical inspection systems for use in the manufacturing of integrated circuits, including logic, high-bandwidth memory (HBM), dynamic random-access memory (DRAM), and 3D NAND devices; semiconductor process monitoring instruments; downloadable software for controlling and analyzing data from wafer inspection systems

Apparatus and instruments for physics; Diagnostic equipment for research laboratory use; Marine navigation equipment and instruments; Surveying apparatus and instruments; Photographic cameras; Optical instruments; Weighing machines; Measures; Signal lanterns; Computer monitors; Life saving apparatus and equipment; Teaching apparatus and equipment; Cinematographic cameras; Electric installations for the remote control of industrial operations; Power converters; Electric apparatus for commutation; Regulating apparatus, electric; Pneumatic-electrical control device; Accumulators, electric; Recorders for sound and image medias; Sound transmitting apparatus; Sound reproduction apparatus; Central Processing Unit (CPU) for information, data, sounds and images processing; Blank magnetic data carriers; Recordable blank DVD discs; Mechanisms for coin-operated apparatus; Cash registers; Calculating machines; Data processing apparatus; Computers; Computer software, recorded; Computer software applications, downloadable; Fire-extinguishing apparatus; Monocrystalline silicon; Electronic chip; Carbon material; Transistors; electricity control panels; Audio and video compact discs

Apparatus and instruments for physics; Diagnostic equipment for research laboratory use; Marine navigation equipment and instruments; Surveying apparatus and instruments; Photographic cameras; Optical instruments; Weighing machines; Measures; Signal lanterns; Computer monitors; Life saving apparatus and equipment; Teaching apparatus and equipment; Cinematographic cameras; Electric installations for the remote control of industrial operations; Power converters; Electric apparatus for commutation; Regulating apparatus, electric; Pneumatic-electrical control device; Accumulators, electric; Recorders for sound and image medias; Sound transmitting apparatus; Sound reproduction apparatus; Central Processing Unit (CPU) for information, data, sounds and images processing; Blank magnetic data carriers; Recordable blank DVD discs; Mechanisms for coin-operated apparatus; Cash registers; Calculating machines; Data processing apparatus; Computers; Computer software, recorded; Computer software applications, downloadable; Fire-extinguishing apparatus; Monocrystalline silicon; Electronic chip; Carbon material; Transistors; electricity control panels; Audio and video compact discs

Apparatus and instruments for physics; Diagnostic equipment for research laboratory use; Marine navigation equipment and instruments; Surveying apparatus and instruments; Photographic cameras; Optical instruments; Weighing machines; Measures; Signal lanterns; Computer monitors; Life saving apparatus and equipment; Teaching apparatus and equipment; Cinematographic cameras; Electric installations for the remote control of industrial operations; Power converters; Electric apparatus for commutation; Regulating apparatus, electric; Pneumatic-electrical control device; Accumulators, electric; Recorders for sound and image medias; Sound transmitting apparatus; Sound reproduction apparatus; Central Processing Unit (CPU) for information, data, sounds and images processing; Blank magnetic data carriers; Recordable blank DVD discs; Mechanisms for coin-operated apparatus; Cash registers; Calculating machines; Data processing apparatus; Computers; Computer software, recorded; Computer software applications, downloadable; Fire-extinguishing apparatus; Monocrystalline silicon; Electronic chip; Carbon material; Transistors; electricity control panels; Audio and video compact discs

Apparatus and instruments for physics; Diagnostic equipment for research laboratory use; Marine navigation equipment and instruments; Surveying apparatus and instruments; Photographic cameras; Optical instruments; Weighing machines; Measures; Signal lanterns; Computer monitors; Life saving apparatus and equipment; Teaching apparatus and equipment; Cinematographic cameras; Electric installations for the remote control of industrial operations; Power converters; Electric apparatus for commutation; Regulating apparatus, electric; Pneumatic-electrical control device; Accumulators, electric; Recorders for sound and image medias; Sound transmitting apparatus; Sound reproduction apparatus; Central Processing Unit (CPU) for information, data, sounds and images processing; Blank magnetic data carriers; Recordable blank DVD discs; Mechanisms for coin-operated apparatus; Cash registers; Calculating machines; Data processing apparatus; Computers; Computer software, recorded; Computer software applications, downloadable; Fire-extinguishing apparatus; Monocrystalline silicon; Electronic chip; Carbon material; Transistors; electricity control panels; Audio and video compact discs

Apparatus and instruments for physics; Diagnostic equipment for research laboratory use; Marine navigation equipment and instruments; Surveying apparatus and instruments; Photographic cameras; Optical instruments; Weighing machines; Measures; Signal lanterns; Computer monitors; Life saving apparatus and equipment; Teaching apparatus and equipment; Cinematographic cameras; Electric installations for the remote control of industrial operations; Power converters; Electric apparatus for commutation; Regulating apparatus, electric; Pneumatic-electrical control device; Accumulators, electric; Recorders for sound and image medias; Sound transmitting apparatus; Sound reproduction apparatus; Central Processing Unit (CPU) for information, data, sounds and images processing; Blank magnetic data carriers; Recordable blank DVD discs; Mechanisms for coin-operated apparatus; Cash registers; Calculating machines; Data processing apparatus; Computers; Computer software, recorded; Computer software applications, downloadable; Fire-extinguishing apparatus; Monocrystalline silicon; Electronic chip; Carbon material; Transistors; electricity control panels; Audio and video compact discs

Apparatus and instruments for physics; Diagnostic equipment for research laboratory use; Marine navigation equipment and instruments; Surveying apparatus and instruments; Photographic cameras; Optical instruments; Weighing machines; Measures; Signal lanterns; Computer monitors; Life saving apparatus and equipment; Teaching apparatus and equipment; Cinematographic cameras; Electric installations for the remote control of industrial operations; Power converters; Electric apparatus for commutation; Regulating apparatus, electric; Pneumatic-electrical control device; Accumulators, electric; Recorders for sound and image medias; Sound transmitting apparatus; Sound reproduction apparatus; Central Processing Unit (CPU) for information, data, sounds and images processing; Blank magnetic data carriers; Recordable blank DVD discs; Mechanisms for coin-operated apparatus; Cash registers; Calculating machines; Data processing apparatus; Computers; Computer software, recorded; Computer software applications, downloadable; Fire-extinguishing apparatus; Monocrystalline silicon; Electronic chip; Carbon material; Transistors; electricity control panels; Audio and video compact discs

Apparatus and instruments for physics; Diagnostic equipment for research laboratory use; Marine navigation equipment and instruments; Surveying apparatus and instruments; Photographic cameras; Optical instruments; Weighing machines; Measures; Signal lanterns; Computer monitors; Life saving apparatus and equipment; Teaching apparatus and equipment; Cinematographic cameras; Electric installations for the remote control of industrial operations; Power converters; Electric apparatus for commutation; Regulating apparatus, electric; Pneumatic-electrical control device; Accumulators, electric; Recorders for sound and image medias; Sound transmitting apparatus; Sound reproduction apparatus; Central Processing Unit (CPU) for information, data, sounds and images processing; Blank magnetic data carriers; Recordable blank DVD discs; Mechanisms for coin-operated apparatus; Cash registers; Calculating machines; Data processing apparatus; Computers; Computer software, recorded; Computer software applications, downloadable; Fire-extinguishing apparatus; Monocrystalline silicon; Electronic chip; Carbon material; Transistors; electricity control panels ; Audio and video compact discs

Apparatus and instruments for physics; Diagnostic equipment for research laboratory use; Marine navigation equipment and instruments; Surveying apparatus and instruments; Photographic cameras; Optical instruments; Weighing machines; Measures; Signal lanterns; Computer monitors; Life saving apparatus and equipment; Teaching apparatus and equipment; Cinematographic cameras; Electric installations for the remote control of industrial operations; Power converters; Electric apparatus for commutation; Regulating apparatus, electric; Pneumatic-electrical control device; Accumulators, electric; Recorders for sound and image medias; Sound transmitting apparatus; Sound reproduction apparatus; Central Processing Unit (CPU) for information, data, sounds and images processing; Blank magnetic data carriers; Recordable blank DVD discs; Mechanisms for coin-operated apparatus; Cash registers; Calculating machines; Data processing apparatus; Computers; Computer software, recorded; Computer software applications, downloadable; Fire-extinguishing apparatus; Monocrystalline silicon; Electronic chip; Carbon material; Transistors; electricity control panels ; Audio and video compact discs

Apparatus and instruments for physics; Diagnostic equipment for research laboratory use; Marine navigation equipment and instruments; Surveying apparatus and instruments; Photographic cameras; Optical instruments; Weighing machines; Measures; Signal lanterns; Computer monitors; Life saving apparatus and equipment; Teaching apparatus and equipment; Cinematographic cameras; Electric installations for the remote control of industrial operations; Power converters; Electric apparatus for commutation; Regulating apparatus, electric; Pneumatic-electrical control device; Accumulators, electric; Recorders for sound and image medias; Sound transmitting apparatus; Sound reproduction apparatus; Central Processing Unit (CPU) for information, data, sounds and images processing; Blank magnetic data carriers; Recordable blank DVD discs; Mechanisms for coin-operated apparatus; Cash registers; Calculating machines; Data processing apparatus; Computers; Computer software, recorded; Computer software applications, downloadable; Fire-extinguishing apparatus; Monocrystalline silicon; Electronic chip; Carbon material; Transistors; electricity control panels ; Audio and video compact discs

Apparatus and instruments for physics; Diagnostic equipment for research laboratory use; Marine navigation equipment and instruments; Surveying apparatus and instruments; Photographic cameras; Optical instruments; Weighing machines; Measures; Signal lanterns; Computer monitors; Life saving apparatus and equipment; Teaching apparatus and equipment; Cinematographic cameras; Electric installations for the remote control of industrial operations; Power converters; Electric apparatus for commutation; Regulating apparatus, electric; Pneumatic-electrical control device; Accumulators, electric; Recorders for sound and image medias; Sound transmitting apparatus; Sound reproduction apparatus; Central Processing Unit (CPU) for information, data, sounds and images processing; Blank magnetic data carriers; Recordable blank DVD discs; Mechanisms for coin-operated apparatus; Cash registers; Calculating machines; Data processing apparatus; Computers; Computer software, recorded; Computer software applications, downloadable; Fire-extinguishing apparatus; Monocrystalline silicon; Electronic chip; Carbon material; Transistors; electricity control panels ; Audio and video compact discs

Apparatus and instruments for physics; Diagnostic equipment for research laboratory use; Marine navigation equipment and instruments; Surveying apparatus and instruments; Photographic cameras; Optical instruments; Weighing machines; Measures; Signal lanterns; Computer monitors; Life saving apparatus and equipment; Teaching apparatus and equipment; Cinematographic cameras; Electric installations for the remote control of industrial operations; Power converters; Electric apparatus for commutation; Regulating apparatus, electric; Pneumatic-electrical control device; Accumulators, electric; Recorders for sound and image medias; Sound transmitting apparatus; Sound reproduction apparatus; Central Processing Unit (CPU) for information, data, sounds and images processing; Blank magnetic data carriers; Recordable blank DVD discs; Mechanisms for coin-operated apparatus; Cash registers; Calculating machines; Data processing apparatus; Computers; Computer software, recorded; Computer software applications, downloadable; Fire-extinguishing apparatus; Monocrystalline silicon; Electronic chip; Carbon material; Transistors; electricity control panels ; Audio and video compact discs

Imaging metrology tools, namely, scientific and electronic imaging instruments for inspecting and characterizing physical properties, including micro-bump arrays, of semiconductors, integrated circuits, and microelectronics, and their packaging; Computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, and microelectronics; Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, semiconductor panels, and their packaging; Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers, semiconductor panels, and their packaging

Automated optical inspection and metrology system for advanced process control during manufacturing of high end integrated circuit substrates

Downloadable computer simulation software for identifying stochastic defects in semiconductor wafers; Downloadable computer software for use in predicting stochastic failures in integrated circuit layouts; Downloadable computer software for ranking the severity of stochastic defects in integrated circuit layouts; Downloadable computer software for simulating stochastic effectivity in integrated circuit layouts; Computer software simulation services, namely, providing online non-downloadable computer software for identifying stochastic defects in semiconductor wafers; Computer software services, namely, providing online non-downloadable computer software for use in predicting stochastic failures in integrated circuit layouts; Computer software services, namely, providing online non-downloadable computer software for ranking the severity of stochastic defects in integrated circuit layouts; Computer software services, namely, providing online non-downloadable computer software for simulating stochastic effectivity in integrated circuit layouts; Software as a service featuring software for identifying stochastic defects in semiconductor wafers; Software as a service featuring software for use in predicting stochastic failures in integrated circuit layouts; Software as a service featuring software for ranking the severity of stochastic defects in integrated circuit layouts; Software as a service featuring software for simulating stochastic effectivity in integrated circuit layouts

scientific instruments, namely, contacting instruments for use in inspection and measurement of sheet resistance of a conducting sample through the use of a contacting probe or pin arrangement; scientific instruments, namely, non-contacting instruments for use in inspection and measurement of sheet resistance of a conducting sample through the use of eddy currents in a non-contacting arrangement

Server hardware and computer hardware that utilizes various model-based and model-less machine learning approaches to provide thickness, critical dimensions, material properties, and other key measurements based on raw signals collected from optical and X-ray metrology tools to enable on-demand, manual, and automatic recipe tuning, recipe import and export, and recipe database management

Apparatus and instruments for recording, transmitting, reproducing or processing sound, images or data; recorded and downloadable digital media, namely, pre-recorded dvds, downloadable audio and video recordings, and CDs in the field of surface data analysis, surface visualization, and report generation; downloadable computer software for surface data analysis, namely, 2D and 3D surface data analysis, surface visualization, and report generation; blank digital or analogue recording and storage in the field of surface data analysis, namely, 2D/3D surface data analysis, surface visualization, report generation; Calculating devices, namely, calculators; Computers; Computer peripheral devices; Scaling and measuring instruments, namely, surface roughness testing machines and instruments, namely, profilometers and profilers; Measuring apparatus and measuring instruments, namely, stylus profilometers and stylus profilers for use in identifying and measuring physical and surface topography properties and for use in research and development regarding same; Electronic and optical instruments for measuring surfaces and for use in research and development regarding same; Surface roughness testing machines and instruments; Instruments for testing and inspecting physical and electrical properties of semiconductors, compound semiconductor, solar components, light emitting diodes, micro-electro-mechanical systems, medical devices, automotive components and data storage and for use in research and development regarding same; Computer hardware and downloadable software used for testing and inspecting physical and electrical properties of semiconductors, compound semiconductor, solar components, Light emitting diodes, Micro-electro-mechanical systems, medical devices, automotive components and data storage and for use in research and development regarding same

Data analytics computer hardware and prerecorded and downloadable computer software for correcting process issues and achieving higher yield for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer hardware and prerecorded and downloadable computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer hardware and downloadable and prerecorded computer software for use in detecting imperfections and faults in semiconductors, integrated circuits, microelectronics, and wafers

Downloadable and prerecorded computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer hardware and downloadable and prerecorded computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers; computer hardware and downloadable and prerecorded computer software for use in detecting imperfections and faults in semiconductor electronic components, integrated circuits, microelectronics, and wafers

Scientific, electrical and measuring apparatus and instruments for determining and analyzing physical properties of materials, namely, for testing and performing measurements on solids and thin films to determine physical and mechanical properties for hardness, fracture toughness, hardness, strain-rate sensitivity, creep, stress relaxation, adhesion, interfacial friction, yield strength, residual stress, fracture toughness, and bonding; computer hardware and downloadable and prerecorded software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers; electrical and scientific instruments for testing, inspecting, and characterizing physical properties of semiconductors, integrated circuits, microelectronics, and wafers

Computer hardware and downloadable and prerecorded computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer hardware and downloadable and prerecorded computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers; computer hardware and downloadable and prerecorded computer software for use in detecting imperfections and faults in semiconductor electronic components, integrated circuits, microelectronics, and wafers

Computer hardware and downloadable and prerecorded computer software all for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; imaging metrology tools, namely, scientific and electronic imaging instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer hardware and downloadable and prerecorded computer software for use in managing and controlling the manufacturing process and yield of semiconductors and integrated circuits in the semiconductor, integrated circuit and related microelectronics manufacturing industries; recorded computer software used for event prediction in the manufacturing of semiconductors and integrated circuits

Computer hardware and downloadable and prerecorded computer software all for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; imaging metrology tools, namely, scientific and electronic imaging instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer hardware and downloadable and prerecorded computer software for use in managing and controlling the manufacturing process and yield of semiconductors and integrated circuits in the semiconductor, integrated circuit and related microelectronics manufacturing industries; recorded computer software used for event prediction in the manufacturing of semiconductors and integrated circuits

Downloadable computer simulation software used for monitoring, controlling, accelerating and improving semiconductor and integrated circuit manufacturing processes; downloadable computer software for use in managing and controlling the manufacturing process and yield of semiconductors and integrated circuits in the semiconductor, integrated circuit and related microelectronics manufacturing industries; downloadable computer software used for event prediction in the manufacturing of semiconductors and integrated circuits; recorded computer simulation software used for monitoring, controlling, accelerating and improving semiconductor and integrated circuit manufacturing processes; recorded computer software for use in managing and controlling the manufacturing process and yield of semiconductors and integrated circuits in the semiconductor, integrated circuit and related microelectronics manufacturing industries; recorded computer software used for event prediction in the manufacturing of semiconductors and integrated circuits

Computer hardware, namely, computer server blade units to be used in integrated circuits manufacturing and testing; computer hardware and downloadable and prerecorded computer software all for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; electronic and scientific instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits

Inspection system comprised of a laser, recorded computer software, and computer hardware for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; instruments for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; computer hardware and recorded software used for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; all of the aforesaid not including any software relating to or connected with managing real estate, property management, property construction and development and performing of related accounting functions

Optical thin-film and surface measuring instruments, namely, systems comprised of computers, spectrometers, video cameras, lamps, fiber optic cables, lenses, and mechanical translation components sold as a unit, for measuring the thickness, deposition rate, refractive index and surface profile of dielectric, semiconductor, and metal materials

instruments for testing, inspecting, and characterizing physical properties of reticles; computer hardware and software used for testing, inspecting, and characterizing physical properties of reticles

Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for providing analytic data on the performance of inspection and metrology tools; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits; reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for use in detecting defective semiconductor electronic components

Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for providing analytic data on the performance of inspection and metrology tools; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits; reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for use in detecting defective semiconductor electronic components

Consulting services in the field of product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries; consulting services in the field of product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries with respect to yield management; providing technical information in the field of inspection, metrology and testing of the physical and electrical properties of semiconductors, integrated circuits and microelectronics for quality control

Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for providing analytic data on the performance of inspection and metrology tools; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits; reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for use in detecting defective semiconductor electronic components

instruments for testing, inspecting, and characterizing physical properties of semiconductor wafers, integrated circuits, and reticles; computer hardware and software used for testing, inspecting, and characterizing physical properties of semiconductor wafers, integrated circuits, and reticles; computer hardware and software used for monitoring and controlling semiconductor wafer, integrated circuit, and reticle manufacturing processes; computer hardware and software used for providing feedback about device parameters used in the manufacturing of semiconductor wafers, integrated circuits, and reticles

computer hardware and software used for testing, inspecting, characterizing, and predicting physical properties of semiconductors and integrated circuits; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits

metrology system comprised of computer software and computer hardware for testing and characterizing physical properties of semiconductors and integrated circuits, namely, critical dimension and shape; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer hardware and software used for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer hardware and software used for monitoring and controlling semiconductor manufacturing processes; computer hardware and software used for providing feedback about device parameters to semiconductor and integrated circuit manufacturers

Software for use in processing and analyzing data from electro-optical instruments, systems and processes for near real time and post processing applications to provide data of properties of a surface of a material or substrate | Non-downloadable online software for use in processing and analyzing data from electro-optical instruments, systems and processes for near real time and post processing applications to provide data of properties of a surface of a material or substrate

Computer hardware; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing in the automotive industry; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for use in detecting defective semiconductor electronic components

photomask blank inspection tool in the nature of testing equipment comprised of computer hardware, computer software, lasers, and optical inspectors for use in the manufacturing, testing and inspection of photomask blanks; computer hardware for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and photomask blanks; computer software for use in process control and yield management for the photomask blanks, semiconductor, integrated circuits and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and photomask blanks; computer software for providing analytic data on the performance of inspection and metrology tools

Computer hardware; semiconductor and wafer defect inspection systems; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; a feature of semiconductor and wafer defect inspection systems for improving the detection of defects on advanced logic and memory IC devices across a broad range of process layers

Optical thin-film and surface measuring instruments, namely, systems comprised of computers, spectrometers, video cameras, lamps, fiber optic cables, lenses, and mechanical translation components sold as a unit, for measuring the thickness, deposition rate, refractive index, and surface profile of dielectric, semiconductor, and metal materials

Optical thin-film and surface measuring instruments, namely, systems comprised of computers, spectrometers, video cameras, lamps, fiber optic cables, lenses, and mechanical translation components sold as a unit, for measuring the thickness, deposition rate, refractive index and surface profile of dielectric, semiconductor, and metal materials

Optical thin-film and surface measuring instruments, namely, systems comprised of computers, spectrometers, video cameras, lamps, fiber optic cables, lenses, and mechanical translation components sold as a unit, for measuring the thickness, deposition rate, refractive index, and surface profile of dielectric, semiconductor, and metal materials

Scientific instrumentation for mechanical property testing, namely, nanoindentation testing of thin films and bulk materials to determine hardness, modulus, and other material properties; computer software for mechanical property testing; Scientific and technological services, namely, contract laboratory testing of mechanical properties

Class 009: Computer hardware for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics

"PATTERNING CONTROL SOLUTION"

Electro-optical instruments for use in inspection and measurement of industrial components

Electro-optical instruments for use in inspection and measurement of industrial components

Nanomechanical laboratory testing instruments, namely, nanoindentation testing instruments having probes, transducers and controllers with and without in-situ testing capability and operating computer software and/or operating computer firmware therefor