KLA-TENCOR CORPORATION

Class 009: Evaluation machines and associated operating software for semiconductor-based products

Class 009: Evaluation machines and associated operating software for semiconductor-based products, all for evaluating surface characteristics, conditions and defects

evaluation machines and associated operating software for semiconductor-based products

evaluation machines, namely, inspection and measurement machines for defect and particle detection for semiconductor-based products, and associated operating software

"CD"

"ANALYZER"

Class 009: Scanning electron microscope system, namely, scanning electronic microscope, computer hardware and software all for reviewing and analyzing defects in semiconductor wafers in the field of semiconductor manufacturing and processing

Class 009: Computer hardware and accompanying software used to produce, encode, write, test, measure, inspect, certify and/or verify computer server disks, magnetic media and/or optical media.

Apparatus for measurement of silicon wafer thickness, flatness and shape

laser surface scanning system comprised of a laser, a computer and a rotating translating stage for inspection of non-patterned monitor wafers with deposited films used in semiconductor wafers

computer hardware, software and user manuals sold as a unit, and equipment, namely inspection, metrology and testing hardware, all for inspecting and measuring semiconductors during manufacturing and processing

Computer hardware, software, and user manuals sold as a unit, and equipment, all for inspecting and measuring semiconductor devices

computer hardware, software and user manuals sold as a unit, and equipment, namely inspection, metrology and testing hardware, all for inspecting and measuring semiconductors during manufacturing and processing

Computer hardware, software, and user manuals sold as a unit, and equipment, all for inspecting and measuring semiconductor devices

Computer hardware, software and user manuals sold as a unit, and equipment, namely inspection, metrology and testing hardware, all for inspecting and measuring semiconductors during manufacturing and processing

Computer hardware, software, and user manuals sold as a unit, and equipment, all for inspecting and measuring semiconductor devices

Computer hardware, software and user manuals sold as a unit, and equipment, namely inspection, metrology and testing hardware, all for inspecting and measuring semiconductors during manufacturing and processing

Computer hardware, software and user manuals sold as a unit, and equipment, namely inspection, metrology and testing hardware, all for inspecting and measuring semiconductors during manufacturing and processing

Computer hardware, software and user manuals sold as a unit, and equipment, namely inspection, metrology and testing hardware, all for inspecting and measuring semiconductors

OPTICAL SYSTEM FOR MEASURING THE CURVATURE OF A SEMICONDUCTOR WAFER, COMPOSED OF A LIGHT SOURCE AND A DETECTOR AND A PROCESSOR FOR CALCULATING THE CURVATURE OF THE WAFER AND DETERMINING THE STRESS IN A FILM DEPOSITED ON THE WAFER

Computer hardware, software, and user manuals sold as a unit, all for inspecting and measuring semiconductor devices; and equipment, namely, instruments used for measuring physical properties of semiconductors

Class 042: provision of consulting services in connection with testing and analysis for the improvement of yield in semiconductor manufacturing

computer software for yield management in semiconductor manufacturing

OPTICAL INSPECTION EQUIPMENT COMPRISED OF AT LEAST ONE LIGHT SOURCE ARRANGED TO INTERACT WITH A SEMICONDUCTOR WAFER IN ORDER TO DETERMINE THE CHARACTERISTICS THEREOF; "ELLIPSOMETER"

instruments, namely, automated semiconductor wafer test equipment, for testing and inspecting physical and electrical properties of semiconductors, computer hardware and software used for testing and inspecting physical and electrical properties of semiconductors, computer hardware and software for yield management in semiconductor manufacturing and testing

OPTICAL INSPECTION DEVICE COMPRISED OF AT LEAST TWO ELLIPSOMETERS AND A MICROPROCESSOR, FOR USE IN MONITORING CHARACTERISTICS OF SEMICONDUCTORS DURING FABRICATION

OPTICAL INSPECTION DEVICE COMPRISED OF AT LEAST TWO ELLIPSOMETERS AND A MICROPROCESSOR, FOR USE IN MONITORING CHARACTERISTICS OF SEMICONDUCTORS DURING FABRICATION

computer software for yield management in semiconductor manufacturing and testing

computer software for yield management in semiconductor manufacturing and testing

computer software for yield management in semiconductor manufacturing and testing; "SAMPLING"

consulting services in the field of manufacturing of semiconductors

consulting services in the field of manufacturing of semiconductors

computer software for yield management in semiconductor manufacturing and testing

consulting services in the field of manufacturing of semiconductors

consulting services in the field of manufacturing of semiconductors

apparatus and software for inspecting semiconductors, semiconductor wafers and parts therefor

apparatus and software for inspecting semiconductors, semiconductor wafers, and related components

INSTRUMENTS FOR TESTING AND INSPECTING PHYSICAL AND ELECTRICAL PROPERTIES OF SEMICONDUCTORS; COMPUTER HARDWARE AND SOFTWARE USED FOR TESTING AND INSPECTING PHYSICAL AND ELECTRICAL PROPERTIES OF SEMICONDUCTORS

Automated inspection device comprising optical scanning hardware and software for the inspection and analysis of data, namely, the inspection and characterization of semiconductor wafers for defects

Computer software used to provide central recipe storage and to create, edit, and save recipe files regarding semiconductor wafer data and to manage multiple machine configurations

measuring system comprising computer hardware and software for measuring film thickness, namely, EPI thickness, transition layer thickness and substrate carrier concentration of semiconductor wafers

Computer hardware and computer software for coordinating semiconductor processing functions

Inspection system comprised of a laser, recorded computer software, and computer hardware for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; instruments for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; computer hardware and recorded software used for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; all of the aforesaid not including any software relating to or connected with managing real estate, property management, property construction and development and performing of related accounting functions

instruments for testing, inspecting, and characterizing physical properties of reticles; computer hardware and software used for testing, inspecting, and characterizing physical properties of reticles

Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for providing analytic data on the performance of inspection and metrology tools; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits; reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for use in detecting defective semiconductor electronic components

Consulting services in the field of product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries; consulting services in the field of product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries with respect to yield management; providing technical information in the field of inspection, metrology and testing of the physical and electrical properties of semiconductors, integrated circuits and microelectronics for quality control

Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for providing analytic data on the performance of inspection and metrology tools; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits; reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for use in detecting defective semiconductor electronic components

Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for providing analytic data on the performance of inspection and metrology tools; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits; reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for use in detecting defective semiconductor electronic components

instruments for testing, inspecting, and characterizing physical properties of semiconductor wafers, integrated circuits, and reticles; computer hardware and software used for testing, inspecting, and characterizing physical properties of semiconductor wafers, integrated circuits, and reticles; computer hardware and software used for monitoring and controlling semiconductor wafer, integrated circuit, and reticle manufacturing processes; computer hardware and software used for providing feedback about device parameters used in the manufacturing of semiconductor wafers, integrated circuits, and reticles

computer hardware and software used for testing, inspecting, characterizing, and predicting physical properties of semiconductors and integrated circuits; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits

metrology system comprised of computer software and computer hardware for testing and characterizing physical properties of semiconductors and integrated circuits, namely, critical dimension and shape; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer hardware and software used for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer hardware and software used for monitoring and controlling semiconductor manufacturing processes; computer hardware and software used for providing feedback about device parameters to semiconductor and integrated circuit manufacturers

Computer hardware; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing in the automotive industry; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for use in detecting defective semiconductor electronic components