BRUKER NANO, INC.

Description: Apparatus and instruments for physics; test instruments; testing apparatus not for medical purposes; ductility tester; microhardness tester; tensile testers; precision measuring apparatus; material testing instruments and machines; electromagnetic measuring & testing equipment.

Description: Downloadable computer software for operating scanning probe microscopes and atomic force microscopes and computer hardware for operating scanning probe microscopes and atomic force microscopes

Description: Class 9: Microscopes; Downloadable and recorded software for use in controlling scientific apparatus and instruments during laboratory operations; Downloadable and recorded software for facilitating the operation and control of microscopes and other scientific apparatus and instruments for scientific, biological, genetic, chemical, pharmaceutical and medical research and analysis; Downloadable and recorded software used to identify, image and model cell morphology, phenotype and protein expression, and for the analysis and selection of cells in tissue, cell pellets and individual cells, biological material, and chemicals, and for facilitating the operation of microscopes and other scientific apparatus and instruments for scientific, biological, genetic, chemical, pharmaceutical and medical research and analysis; Laboratory devices, apparatus and equipment, namely, microscopes, downloadable computer software and photographic equipment in the nature of cameras for optical imaging; Laboratory instruments, namely, microscopes, imaging apparatus and fluorescent chemistry analyzer instruments sold as a unit for use in the study of phenotyping, spatial biology and proteomics; Laboratory instruments, namely, clinical chemistry fluorescence spectroscopy analyzers for research use for the analysis of biological samples; Scientific research instruments, namely, an automated quantitative imaging apparatus for use in imaging tissue and cellular samples labeled with multiple dyes or stains for recording, transmission and reproduction of images; Scientific laboratory research instruments for immunofluorescence imaging; Scientific laboratory research instruments for high dynamic range (HDR) microscopy imaging
Class 42: Scientific research and development in the field of biological research, genetics, chemical, pharmaceutical and medical research, and analysis services; scientific laboratory services, and scientific research consulting; Scientific research and development in the field of biological research, genetics, chemical, pharmaceutical and medical research, and analysis in the field of phenotyping, spatial biology and proteomics

Description: Recorded software and electronic circuit hardware for operating probe-based instruments, namely, scanning probe microscopes and atomic force microscopes

Description: Software and Hardware for operating probe-based instruments, namely, scanning probe microscopes and atomic force microscopes

Description: Probe-based instruments, namely, scanning probe microscopes including atomic force microscopes

Description: Imaging control feature sold as an integral component of downloadable and recorded computer software for operating scanning probe microscopes and atomic force microscopes; computer hardware for operating scanning probe microscopes and atomic force microscopes

Description: Recorded and downloadable software for operating probe-based instruments in the fields of manufacturing and scientific research; hardware for facilitating a mode of operation sold as integral part of probe-based instruments, namely, scanning probe microscopes and atomic force microscopes

Description: Digital microscopes; digital microscope parts, namely, couplers; digital microscope parts, namely, lens probes; computer hardware for processing images and video; downloadable computer software for viewing, recording, saving, and analyzing images and video; all the foregoing for use in viewing, analyzing, and recording brain signals, namely neurotransmitter activity and blood flow; none of the foregoing for use in connection with ventilators, anesthesia machines, retinal imaging, ophthalmic cameras, or ophthalmoscopes

Description: Metrology instruments, namely, scanning probe microscopes

Description: Probe-based instruments, namely, atomic force microscopes, and recorded software for operating probe-based instruments

Description: Probe-based instruments, namely, atomic force microscopes and recorded operating software sold as a unit

Description: Tribology and micromechanical testing instruments, namely, tribometers and mechanical testers in the nature of macro-, micro- and nanomechanical testing instruments for conducting friction and wear testing as well as compression, tensile, torsional, indentation, lateral force, scratch, and fatigue testing, and data acquisition in ambient and controlled low and high temperature environments and under vacuum

Description: Microscopes, and accessories therefor, namely, a holographic image generation attachment

Description: Probe-based instrument, namely, scanning probe microscopes, in particular, an atomic force microscope, used to acquire data corresponding to submicron scale sample features

Description: Probe-based instrument, namely, scanning probe microscopes, in particular, an atomic force microscope, used to acquire data corresponding to submicron scale sample features

Description: Downloadable industrial process control software; Electro-optical instruments for use in inspection and measurement of industrial components; Industrial X-ray apparatus in the nature of testing equipment for determining industrial flaws; Instruments for detecting and measuring two-dimensional distribution of force and pressure; Water testing instrumentation for monitoring and detecting contamination; X-ray apparatus not for medical purposes

Description: Downloadable industrial process control software; Electro-optical instruments for use in inspection and measurement of industrial components; Industrial X-ray apparatus in the nature of testing equipment for determining industrial flaws; Instruments for detecting and measuring two-dimensional distribution of force and pressure; Water testing instrumentation for monitoring and detecting contamination; X-ray apparatus not for medical purposes

Description: Software employed to operate scanning probe microscopes, including atomic force microscopes

Description: Software employed to operate scanning probe microscopes, including atomic force microscopes

Description: Scanning probe microscopes; software for operating scanning probe microscopes

Description: Digital microscopes; digital microscope equipment, namely, couplers; digital microscope lens probes; computer hardware for processing images and video; computer software for viewing, recording, saving, and analyzing images and video | Digital imaging services | Providing on-line non-downloadable software for viewing, recording, saving, and analyzing images and video

Description: Digital microscopes; digital microscope equipment, namely, couplers; digital microscope lens probes; computer hardware for processing images and video for use in neuroscience research and development; computer software for viewing, recording, saving, and analyzing images and video for use in neuroscience research and development

Description: Photomask repair systems comprising hardware and software for the removal and mitigation of haze on photomasks

Description: Photomask repair systems comprising hardware and software for the removal and mitigation of haze on photomasks

Description: Photomask repair systems comprising hardware and software for the removal and mitigation of haze on photomasks

Description: "3D"

Description: "3D"

Description: Digital microscopes; digital microscope equipment, namely, couplers; digital microscope lens probes; computer hardware for processing images and video; computer software for viewing, recording, saving, and analyzing images and video

Description: Digital microscope equipment, namely, couplers; digital microscope lens probes

Description: Software for operating probe-based instruments in the fields of manufacturing and scientific research; hardware for facilitating a mode of operation sold as an integral part of probe-based instruments, namely, scanning probe microscopes and atomic force microscopes

Description: Metrology devices, namely, surface profiling machines and optical microscopes for characterizing and measuring surface parameters of samples

Description: Metrology instruments, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs); "VOLUME"

Description: Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atomic force microscopes (AFMs), and software for facilitating the operation of metrology instruments in the nature of scanning probe microscopes (SPMs) and atomic force microscopes (AFMs)

Description: Metrology instrumentation, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs)

Description: Apparatus, test instruments and probes for conducting enhanced micromechanical and nanomechanical testing, measurement and characterization of materials at high temperatures

Description: Probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; software for operating the aforementioned probe-based instruments

Description: Metrology tools for surface analysis and software for enhancing high performance of nanoscale metrology tools

Description: Electronic controllers and software for operating nanomechanical testing instruments and accessories

Description: Software for metrology tools, namely, analysis software for atomic force microscopes

Description: Surface measurement equipment comprised of stylus based surface profilers, and probes and computer software therefor

Description: Probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; Software for operating probe-based instruments

Description: Probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; software for operating probe-based instruments

Description: Metrology devices, namely, surface profiling machines for measuring surface primary form, surface roughness and other surface parameters of samples

Description: Computer software used in connection with metrology instruments or on a standalone basis for measuring and analyzing sample properties, namely, surface primary form, surface waviness, surface roughness and other surface characteristics of samples

Description: Photomask repair systems comprising hardware and software for the removal of debris and defects on photomasks

Description: Photomask repair systems comprising hardware and software for the removal and mitigation of haze on photomasks

Description: SOFTWARE FOR OPERATING PROBE-BASED INSTRUMENTS IN THE FIELDS OF MANUFACTURING AND SCIENTIFIC RESEARCH; HARDWARE FOR FACILITATING MECHANICAL PROPERTY MEASUREMENT OF SAMPLES SOLD AS AN INTEGRAL PART OF PROBE-BASED INSTRUMENTS, NAMELY, SCANNING PROBE MICROSCOPES AND ATOMIC FORCE MICROSCOPES

Description: SOFTWARE FOR OPERATING PROBE-BASED INSTRUMENTS IN THE FIELDS OF MANUFACTURING AND SCIENTIFIC RESEARCH; HARDWARE FOR FACILITATING A MODE OF OPERATION SOLD AS AN INTEGRAL PART OF PROBE-BASED INSTRUMENTS, NAMELY, SCANNING PROBE MICROSCOPES AND ATOMIC FORCE MICROSCOPES

Description: SOFTWARE FOR OPERATING PROBE-BASED INSTRUMENTS; PROBE-BASED INSTRUMENTS IN THE FIELDS OF MANUFACTURING AND SCIENTIFIC RESEARCH; HARDWARE FOR FACILITATING USER EASE-OF-USE SOLD TO BE AN INTEGRAL PART OF PROBE-BASED INSTRUMENTS, NAMELY, SCANNING PROBE MICROSCOPES AND ATOMIC FORCE MICROSCOPES

Description: Photomask repair systems comprising computer hardware and software for the removal of opaque mask defects utilizing an atomic force microscope

Description: Carbon dioxide based cryogenic aerosol cleaning equipment including nozzles, filters, gas delivery and blending components and related hardware for precision spray cleaning a surface to remove unwanted matter and contaminants

Description: Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atomic force microscopes (AFMs), and software for facilitating the operation of metrology instruments in the nature of scanning probe microscopes (SPMs) and atomic force microscopes (AFMs)

Description: Metrology instruments and components thereof, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs)

Description: Mechanical testers in the nature of micro- and nanomechanical testing instruments for conducting compression, tensile, indentation, lateral force, scratch, fatigue, and/or wear testing and data acquisition inside electron microscopes

Description: Nanomechanical testing instruments with and without in situ test capability comprising of probe, transducer, controller and operating computer software and/or operating computer firmware

Description: Nanomechanical testing instruments with and without in situ test capability comprising of probe, transducer, controller and operating computer software and/or operating computer firmware

Description: CARBON DIOXIDE PROCESSING AND CLEANING SYSTEMS AND COMPONENTS THEREOF, NAMELY, AN ENCLOSED PROCESSING/CLEANING ASSEMBLY, CO2 JET SPRAYERS AND SPRAY NOZZLES, HOLDERS AND CONVEYORS FOR HOLDING AND CONVEYING THE MATERIALS TO BE PROCESSED AND CLEANED THROUGH THE PROCESSING/CLEANING ASSEMBLY, AIR BLOWERS, AIR FILTERS, HEATERS FOR HEATING THE MATERIALS TO BE PROCESSED AND CLEANED | CONTROL ELECTRONICS, NAMELY, COMPUTER SOFTWARE FOR USE WITH CO2 PROCESSING AND CLEANING SYSTEMS, NAMELY, FOR CONTROLLING THE INTENSITY AND DIRECTION OF CO2 JET SPRAY, CONTROLLING THE MOVEMENT OF CO2 JET SPRAYERS AND SPRAY NOZZLES, CONTROLLING THE MOVEMENT OF THE CONVEYORS, CONTROLLING THE TEMPERATURE OF INTERIOR OF THE PROCESSING/CLEANING ASSEMBLY AND MATERIALS TO BE CLEANED, CONTROLLING BLOWERS AND FILTERS; AND INSTRUCTION MANUALS SOLD THEREWITH

Description: Metrology instruments and components thereof, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs)

Description: Metrology instruments and components thereof, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs)

Description: High purity gas, namely carbon dioxide for industrial cleaning processes

Description: CO2 snow cleaning systems, primarily composed of carbon dioxide (CO2) filled cylinders and attached nozzles, tubing, and related system tools for use in cleaning of semiconductor wafers, electronic and optical components, and combinations of same

Description: CO2 snow cleaning systems, primarily composed of carbon dioxide (CO2) filled cylinders and attached nozzles, tubing, and related system tools for use in cleaning of semiconductor wafers, electronic and optical components, and combinations of same