CARL ZEISS SMT GMBH

Description: Class 7: Instruments and applications for the correction of wafer forms, namely, semiconductor wafer processing equipment, semiconductor wafer processing machines
Class 9: Instruments and applications for the correction of wafer forms, namely, downloadable computer software for use in processing semiconductor wafers and optical inspection apparatus for inspection of semiconductor materials in the nature of semiconductor wafers; laser systems for correcting distortion of wafers comprised of lasers for measuring and optical sensors; downloadable computer software for inspecting wafers
Class 42: Providing online non-downloadable computer software for inspecting wafers

Description: 3D X-ray inspection and metrology tool in the field of semiconductor measurement and control solutions

Description: Downloadable computer application software for use in semiconductor measurement and semiconductor inspections; Electro-optical instruments for use in inspection and measurement of industrial components, namely semiconductor devices; Optical inspection instruments for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks; "3D"; Providing temporary use of a web-based software application for use in semiconductor measurement and semiconductor inspections

Description: Electro-optical instruments for use in inspection and measurement of industrial components, namely semiconductor devices; Optical inspection instruments for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks; Preinstalled software for semiconductor measurement and semiconductor inspections sold as a component of electro-optical instruments for use in inspection and measurement of industrial components, namely semiconductor devices, and as a component of optical inspection instruments for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks; "3D"

Description: Focused ion beam apparatus comprised of computer hardware and recorded computer software to perform imaging and nano-fabrication analysis and prototyping of integrated circuits

Description: Microscopes and parts thereof; x-ray microscopes and parts thereof; downloadable software used for automated acquisition and registration of x-ray images

Description: Installation, maintenance and repair of semiconductor equipment for others; replacement of worn or defective electronic parts of semiconductor equipment for others; Installation, maintenance, repair and updating of computer software, used in semiconductor equipment, for others; leasing of computer software used in semiconductor equipment

Description: Server for linking instruments used in the semiconductor field and for analyzing and evaluating data obtained from such instruments

Description: Optical inspection apparatus, namely, semiconductor mask inspection apparatus and parts thereof

Description: Measuring instruments to measure positions of structures on photomasks; computer software for use in operating measuring instruments to measure positions of structures on photomasks and evaluating data they provide

Description: Tools for controlling the critical dimensions of photomasks, also commonly referred to as reticles, namely, a machine used to physically alter the photomask, said tool utilizing a laser to locally alter light transmission of said photomask, the foregoing for use in manufacturing photomasks and in lithographic applications

Description: Very high sensitivity transmission measuring tool comprising a deep ultraviolet broadband light source and a deep ultraviolet photodetector for use in manufacturing photomasks that are used in the further manufacture of semiconductors, said tool utilizing non-imaging optics, an ultra-precision motion apparatus and ultra-clean room environment that allows safe handling of semiconductor manufacturing materials

Description: Mask repair tools used in the semiconductor industry

Description: Lens objectives for use with wafersteppers and illuminators

Description: Scientific apparatus, namely, mass spectrometers