MPI CORPORATION logo

MPI CORPORATION

10 Marks
Corp.
First Filed:Mar 13, 2008Latest Filed:Sep 2, 2020Address:1-3F, NO.155, CHUNG-HO ST., HSINCHU COUNTY, R.O.C., TW

Portfolio Overview

Top Classes

Class 9
Electronics, Software & Scientific Equipment
10(100%)
Class 7
Machinery
1(10%)

TTAB Proceedings

No litigation activity

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Trademark Portfolio

10 results

(current & previous marks)

Refine by Mark/Description🔽
Filed
Registered
Last Activity
PROBENIX
PROBENIX
Trademark
Word
REGISTERED
Owner:
Serial:90154026
Filed:Sep 2, 2020
Classes:9
Registration:6572221
Registered:Nov 30, 2021
Description: Test pins for testing circuit boards; Probe cards for testing semiconductor wafer; Testing apparatus for testing printed circuit boards; Probes for testing the radiofrequency or RF of semiconductors
WAFERWALLET
WAFERWALLET
Trademark
Word
REGISTERED
Owner:
Serial:88071817
Filed:Aug 9, 2018
Classes:7, 9
Registration:5952834
Registered:Jan 7, 2020
Description: Probes for testing integrated circuits; test pins for testing circuit boards; probes for testing semiconductors; probe cards for use in connection with inspection of semiconductors and liquid crystal display panels; probe cards for testing semiconductor wafers; testing apparatus for testing circuit boards; testing apparatus for testing integrated circuits; testing apparatus for testing semiconductors; software for performing radiofrequency or RF calibration; computer software for driving probe card; computer software for testing semiconductor devices; probes for testing the radiofrequency or RF of semiconductors; Semiconductor wafer processing machines, namely, wafer loader
IMAG
IMAG
Trademark
Stylized
REGISTERED
Owner:
Serial:87106807
Filed:Jul 18, 2016
Classes:9
Registration:5320341
Registered:Oct 31, 2017
Description: Microscopes, optical lenses, cameras
QALIBRIA
QALIBRIA
Trademark
Word
REGISTERED
Owner:
Serial:86953401
Filed:Mar 25, 2016
Classes:9
Registration:5211876
Registered:May 30, 2017
Description: [ Probes for testing integrated circuits; test pins for testing circuit boards; probes for testing semiconductors; probe cards for use in connection with inspection of semiconductors and liquid crystal display panels; probe cards for testing wafer; testing apparatus for testing circuit boards; testing apparatus for testing integrated circuits; testing apparatus for testing semiconductors; ] RF calibration software; computer software for driving probe card; computer software for testing semiconductor device [ ; RF probes ]
SENTIO
SENTIO
Trademark
Word
REGISTERED
Owner:
Serial:86953402
Filed:Mar 25, 2016
Classes:9
Registration:5211877
Registered:May 30, 2017
Description: [ Probes for testing integrated circuits; test pins for testing circuit boards; probes for testing semiconductors; probe cards for use in connection with inspection of semiconductors and liquid crystal display panels; probe cards for testing wafer; testing apparatus for testing circuit boards; testing apparatus for testing integrated circuits; testing apparatus for testing semiconductors; ] RF calibration software; computer software for driving probe card; computer software for testing semiconductor device [ ; RF probes ]
BRINGING TEMPERATURE TO YOUR TEST
BRINGING TEMPERATURE TO YOUR TEST
Trademark
Combined
REGISTERED
Owner:
Serial:86733281
Filed:Aug 21, 2015
Classes:9
Registration:5365435
Registered:Dec 26, 2017
Description: Semiconductor testing apparatus; testing apparatus for testing printed circuit boards; environmental test chamber, namely, temperature simulation equipment; environmental conditioning equipment, namely, thermal chucks for testing and conditioning semiconductors and electrical equipment; apparatus for delivering air at a controlled temperature, namely, apparatus for maintaining precise temperatures on semiconductors and electrical equipment being tested and conditioned; apparatus for the analyzing and testing of temperature-sensitive items, namely, apparatus for analyzing and testing semiconductors and electrical equipment; measuring and control devices for heating and air conditioning technology; apparatus for testing electrical components under controlled temperature conditions; temperature controllers for testing semiconductor and electrical components; thermostats
THERMALAIR
THERMALAIR
Trademark
Stylized
REGISTERED
Owner:
Serial:86733284
Filed:Aug 21, 2015
Classes:9
Registration:5028813
Registered:Aug 23, 2016
Description: Semiconductor testing apparatus; testing apparatus for testing printed circuit boards; environmental test chamber, namely, temperature simulation equipment; environmental conditioning equipment, namely, thermal chucks for testing and conditioning semiconductors and electrical equipment; apparatus for delivering air at a controlled temperature, namely, apparatus for maintaining precise temperatures on semiconductors and electrical equipment being tested and conditioned; apparatus for the analyzing and testing of temperature-sensitive items, namely, apparatus for analyzing and testing semiconductors and electrical equipment; measuring and control devices for heating and air conditioning technology; apparatus for testing electrical components under controlled temperature conditions; temperature controllers for testing semiconductor and electrical components; thermostats
QALIBRIA
QALIBRIA
Trademark
Word
ABANDONED
Owner:
Serial:86293965
Filed:May 28, 2014
Classes:9
3DS
3DS
Trademark
Combined
CANCELLED
Owner:
Serial:86281743
Filed:May 15, 2014
Classes:9
Registration:5271515
Registered:Aug 22, 2017
MPI
MPI
Trademark
Stylized
REGISTERED
Owner:
Serial:77420622
Filed:Mar 13, 2008
Classes:9
Registration:3658964
Registered:Jul 21, 2009
Description: Probes for testing integrated circuits, probe cards for use in connection with inspection of semiconductors and liquid crystal display panels