RUDOLPH TECHNOLOGIES, INC. logo

RUDOLPH TECHNOLOGIES, INC.

14 Marks
Corp.
First Filed:Jun 23, 1977Latest Filed:Jul 13, 2016Address:16 Jonspin Road, Wilmington, MA 01887

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38

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Class 9
Electronics, Software & Scientific Equipment
14(100%)

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Total Proceedings
3
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1(33%)
As Defendant
2(67%)

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Trademark Portfolio

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Filed
Registered
Last Activity
INTELLIGENT DIGITAL SIGNATURE
ABANDONED
Owner:
Serial:87103001
Filed:Jul 13, 2016
Classes:9
INTELLICHAIN
INTELLICHAIN
Trademark
Word
ABANDONED
Owner:
Serial:86634835
Filed:May 19, 2015
Classes:9
AERO
AERO
Trademark
Word
ABANDONED
Owner:
Serial:86435331
Filed:Oct 27, 2014
Classes:9
DISCOVER SOLAR
DISCOVER SOLAR
Trademark
Word
CANCELLED
Owner:
Serial:77720775
Filed:Apr 23, 2009
Classes:9
Registration:4210357
Registered:Sep 18, 2012
Description: "SOLAR"
PRECISIONPOINT
PRECISIONPOINT
Trademark
Word
CANCELLED
Owner:
Serial:77508444
Filed:Jun 26, 2008
Classes:9
Registration:3579491
Registered:Feb 24, 2009
3D-OCM
3D-OCM
Trademark
Word
ABANDONED
Owner:
Serial:77241124
Filed:Jul 27, 2007
Classes:9
PROBEWORX
PROBEWORX
Trademark
Word
CANCELLED
Owner:
Serial:78464523
Filed:Aug 9, 2004
Classes:9
Registration:3001676
Registered:Sep 27, 2005
PRECISIONWORX ZBA
PRECISIONWORX ZBA
Trademark
Word
CANCELLED
Owner:
Serial:76484501
Filed:Jan 23, 2003
Classes:9
Registration:2797224
Registered:Dec 23, 2003
Description: Hardware and software systems comprising computers, computer software, electronic hardware and mechanical hardware for micropositioning control, namely, the design, manufacture and application of micropositioning control in precision actuators, control systems for photonics, digital flow control, semiconductor test and inspection, and biomedical microscopy and scanning systems
WAFERVIEW
WAFERVIEW
Trademark
Word
CANCELLED
Owner:
Serial:76397470
Filed:Apr 17, 2002
Classes:9
Registration:2680811
Registered:Jan 28, 2003
Description: Lasers, non-coherent light sources, cameras, and computers sold as a unit for semiconductor inspection and automated defect detection and classification
WAFERVIEW
WAFERVIEW
Trademark
Word
CANCELLED
Owner:
Serial:75668014
Filed:Mar 26, 1999
Classes:9
Registration:2507597
Registered:Nov 13, 2001
Description: Computer software for the semiconductor inspection, namely, after-develop inspection and automated defect detection
YIELDVIEW
YIELDVIEW
Trademark
Word
CANCELLED
Owner:
Serial:75668016
Filed:Mar 26, 1999
Classes:9
Registration:2382625
Registered:Sep 5, 2000
Description: Computer software for process and yield modeling, image archiving and yield optimization
YIELDWIZARD
YIELDWIZARD
Trademark
Word
CANCELLED
Owner:
Serial:75668013
Filed:Mar 26, 1999
Classes:9
Registration:2515726
Registered:Dec 4, 2001
Description: Computer software for the purpose of defect classification, automated defect knowledge base generation, cluser analysis, defect detection and defect water mapping in the semiconductor industry
FE-III
FE-III
Trademark
Stylized
CANCELLED
Owner:
Serial:74311123
Filed:Sep 4, 1992
Classes:9
Registration:1790202
Registered:Aug 31, 1993
Description: Ellipsometers
AUTOEL
AUTOEL
Trademark
Word
EXPIRED
Owner:
Serial:73131633
Filed:Jun 23, 1977
Classes:9
Registration:1098633
Registered:Aug 8, 1978
Description: MICRO-COMPUTER CONTROLLED AUTOMATIC ELLIPSOMETER
ONTO INNOVATION
ONTO INNOVATION
Trademark
Word
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REGISTERED
Owner:
Serial:88640856
Filed:Oct 3, 2019
Classes:7
Registration:6479639
Registered:Sep 7, 2021
Description: Lithography machines for the manufacture of microelectronics, integrated circuits, light emitting diodes, and semiconductors on laminar substrates including wafers, glass panels, and packaging panels such as copper plate or plastic; Optical metrology, characterization, and inspection systems comprised of a machine, components and operating software therefor sold as a unit for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies; optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the production of precision machined optical surfaces, optical coatings, and optical assemblies including reference flat, sphere, asphere and assemblies composed of both refractive and reflective components | optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; interferometers for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; downloadable software, namely, process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies | Providing temporary use on online, nondownloadable process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogenous packaging, and other advanced packaging electronics technologies
ANALYZEWORX
ANALYZEWORX
Trademark
Word
Previous
ABANDONED
Owner:
Serial:88341825
Filed:Mar 15, 2019
Classes:9
NOVUSEDGE
NOVUSEDGE
Trademark
Word
Previous
REGISTERED
Owner:
Serial:88339719
Filed:Mar 14, 2019
Classes:9
Registration:6059853
Registered:May 19, 2020
Description: Metrology inspection equipment for use in the manufacturing, inspection, testing and repair of semiconductor substrates
STEPFAST
STEPFAST
Trademark
Word
Previous
REGISTERED
Owner:
Serial:88168607
Filed:Oct 25, 2018
Classes:7
Registration:6289921
Registered:Mar 9, 2021
Description: Machines for manufacturing semiconductors
FASTSTEP
FASTSTEP
Trademark
Word
Previous
ABANDONED
Owner:
Serial:88039086
Filed:Jul 16, 2018
Classes:7
VOYAGER
VOYAGER
Trademark
Word
Previous
ABANDONED
Owner:
Serial:87752951
Filed:Jan 12, 2018
Classes:9
TRUEBUMP
TRUEBUMP
Trademark
Word
Previous
REGISTERED
Owner:
Serial:87567438
Filed:Aug 14, 2017
Classes:9
Registration:5885889
Registered:Oct 15, 2019
Description: Computer software for determining and assessing characteristics of 3D structures, such as bumps, pillars, pads, balls and vias on the aforementioned substrates including position, height, dimensions, and co-planarity
STEPPERMATCH
STEPPERMATCH
Service Mark
Word
Previous
CANCELLED
Owner:
Serial:87565309
Filed:Aug 11, 2017
Classes:42
Registration:5593159
Registered:Oct 30, 2018
Description: Providing nondownloadable graphical user interface software for calibrating differences in disparate machines for manufacturing semiconductors to ensure proper alignment and exposure of the semiconductors during manufacture; Calibration services, namely, calibrating the differences in disparate machines for manufacturing semiconductors to ensure proper alignment and exposure of the semiconductors during manufacture
ACTIONABLE DATA. NOW.
ACTIONABLE DATA. NOW.
Trademark
Word
Previous
ABANDONED
Owner:
Serial:87102992
Filed:Jul 13, 2016
Classes:9
THREAD SYNCHRONIZATION ENGINE
THREAD SYNCHRONIZATION ENGINE
Trademark
Word
Previous
ABANDONED
Owner:
Serial:87103005
Filed:Jul 13, 2016
Classes:9
DISCOVER VIZ
DISCOVER VIZ
Trademark
Word
Previous
CANCELLED
Owner:
Serial:87087046
Filed:Jun 28, 2016
Classes:9
Registration:5408312
Registered:Feb 20, 2018
INTELLIGENT DIGITAL THREADING
INTELLIGENT DIGITAL THREADING
Trademark
Word
Previous
ABANDONED
Owner:
Serial:87087144
Filed:Jun 28, 2016
Classes:9
DRAGONFLY
DRAGONFLY
Trademark
Word
Previous
REGISTERED
Owner:
Serial:87065500
Filed:Jun 9, 2016
Classes:9
Registration:5408263
Registered:Feb 20, 2018
Description: Inspection and metrology equipment and devices, namely, instruments and devices that sense and/or capture images of semiconductor and electronic related components, primarily semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and automatically inspect these images for information such as defects, coordinate or position determination, identification, and/or presence or absence of a feature, characteristic or substance thereon
CLEARFIND
CLEARFIND
Trademark
Word
Previous
REGISTERED
Owner:
Serial:87013869
Filed:Apr 26, 2016
Classes:9
Registration:5775893
Registered:Jun 11, 2019
Description: Optical fluorescence imaging devices for integrated circuit device inspection
FIREFLY
FIREFLY
Trademark
Word
Previous
REGISTERED
Owner:
Serial:86924961
Filed:Mar 1, 2016
Classes:9
Registration:5392368
Registered:Jan 30, 2018
Description: Inspection equipment and devices, namely, equipment and devices that sense and/or capture images of semiconductor and related electronic components including semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and automatically inspect these images for information about structural anomalies, and/or presence or absence of structural anomalies thereon
SONUS
SONUS
Trademark
Word
Previous
CANCELLED
Owner:
Serial:86042410
Filed:Aug 20, 2013
Classes:9
Registration:4846535
Registered:Nov 3, 2015
Description: INSTRUMENTS FOR THE MEASUREMENT OF THICKNESSES, DIMENSIONS AND ADHESION PROPERTIES OF METAL AND OPAQUE FILMS USED IN SEMICONDUCTOR MANUFACTURING AND FOR THE EVALUATION OF PHYSICAL CHARACTERISTICS OF SUBSTRATES USED IN SEMICONDUCTOR MANUFACTURING
JETSTEP
JETSTEP
Trademark
Word
Previous
REGISTERED
Owner:
Serial:85857079
Filed:Feb 22, 2013
Classes:7
Registration:4539375
Registered:May 27, 2014
Description: Machines for manufacturing semiconductors
TRUEADC
TRUEADC
Trademark
Word
Previous
REGISTERED
Owner:
Serial:85795170
Filed:Dec 5, 2012
Classes:9
Registration:4354089
Registered:Jun 18, 2013
Description: Computer software for assessing and categorizing defects in a workpiece including semiconductor substrates, integrated circuit devices, integrated circuit packaging structures and printed circuit boards
PROCESS SENTINEL
PROCESS SENTINEL
Trademark
Word
Previous
CANCELLED
Owner:
Serial:85744551
Filed:Oct 3, 2012
Classes:9
Registration:4349572
Registered:Jun 11, 2013
Description: "PROCESS"
EXPLORER
EXPLORER
Trademark
Word
Previous
REGISTERED
Owner:
Serial:77273013
Filed:Sep 6, 2007
Classes:9
Registration:3498125
Registered:Sep 9, 2008
Description: System for optical semiconductor wafer inspection comprising interchangeable modules, each module being designed for a separate type of optical semiconductor wafer inspection and comprised of brightfield and darkfield illuminators, substrate moving arms, computers, software for controlling the operation thereof and evaluates results therefrom
RUDOLPH
RUDOLPH
Trademark
Stylized
Previous
REGISTERED
Owner:
Serial:77189720
Filed:May 24, 2007
Classes:9
Registration:3444028
Registered:Jun 10, 2008
Description: METROLOGY INSPECTION SYSTEMS COMPRISED OF ONE OR MORE LIGHT SOURCES, ONE OR MORE CAMERAS AND/OR SENSORS IN COMMUNICATION WITH COMPUTER SOFTWARE AND HARDWARE USED FOR THE MEASUREMENT OF THICKNESSES, ADHESION PROPERTIES, AND STRUCTURAL PROPERTIES OF SEMICONDUCTOR MATERIALS AND FOR MONITORING THE PERFORMANCE OF SEMICONDUCTOR FABRICATION PROCESSES; INSPECTION EQUIPMENT AND ASSOCIATED SOFTWARE FOR THE SEMICONDUCTOR INDUSTRY, NAMELY, OPTICAL INSPECTION EQUIPMENT FOR 2D AND 3D INSPECTION OF SEMICONDUCTOR MATERIALS; AND SOFTWARE FOR THE SEMICONDUCTOR INDUSTRY, NAMELY, SOFTWARE FOR IDENTIFYING DEFECTS IN SEMICONDUCTOR STRUCTURES, SOFTWARE FOR IDENTIFYING SEMICONDUCTOR FABRICATION PROCESS EXCURSIONS, SOFTWARE FOR RECORDING AND REVIEWING DEFECTS IN SEMICONDUCTORS STRUCTURES, SOFTWARE FOR IDENTIFYING ROOT CAUSES OF DEFECTS IN SEMICONDUCTOR STRUCTURES, AND SOFTWARE FOR CONTROLLING AND MONITORING SEMICONDUCTOR FABRICATION EQUIPMENT
RUDOLPH
RUDOLPH
Trademark
Word
Previous
REGISTERED
Owner:
Serial:77189724
Filed:May 24, 2007
Classes:9
Registration:3444029
Registered:Jun 10, 2008
Description: METROLOGY INSPECTION SYSTEMS COMPRISED OF ONE OR MORE LIGHT SOURCES, ONE OR MORE CAMERAS AND/OR SENSORS IN COMMUNICATION WITH COMPUTER SOFTWARE AND HARDWARE USED FOR THE MEASUREMENT OF THICKNESSES, ADHESION PROPERTIES, AND STRUCTURAL PROPERTIES OF SEMICONDUCTOR MATERIALS AND FOR MONITORING THE PERFORMANCE OF SEMICONDUCTOR FABRICATION PROCESSES; INSPECTION EQUIPMENT AND ASSOCIATED SOFTWARE FOR THE SEMICONDUCTOR INDUSTRY, NAMELY, OPTICAL INSPECTION EQUIPMENT FOR 2D AND 3D INSPECTION OF SEMICONDUCTOR MATERIALS; AND SOFTWARE FOR THE SEMICONDUCTOR INDUSTRY, NAMELY, SOFTWARE FOR IDENTIFYING DEFECTS IN SEMICONDUCTOR STRUCTURES, SOFTWARE FOR IDENTIFYING SEMICONDUCTOR FABRICATION PROCESS EXCURSIONS, SOFTWARE FOR RECORDING AND REVIEWING DEFECTS IN SEMICONDUCTORS STRUCTURES, SOFTWARE FOR IDENTIFYING ROOT CAUSES OF DEFECTS IN SEMICONDUCTOR STRUCTURES, AND SOFTWARE FOR CONTROLLING AND MONITORING SEMICONDUCTOR FABRICATION EQUIPMENT
DISCOVER
DISCOVER
Trademark
Word
Previous
REGISTERED
Owner:
Serial:77136418
Filed:Mar 21, 2007
Classes:9
Registration:3496573
Registered:Sep 2, 2008
Description: Computer software for data and yield management in semiconductor manufacturing
ARTIST
ARTIST
Trademark
Word
Previous
CANCELLED
Owner:
Serial:77103144
Filed:Feb 8, 2007
Classes:9
Registration:3421457
Registered:May 6, 2008
AUTOSHELL
AUTOSHELL
Trademark
Word
Previous
REGISTERED
Owner:
Serial:77103152
Filed:Feb 8, 2007
Classes:9
Registration:3421458
Registered:May 6, 2008
Description: Downloadable computer software used to create customized factory automation systems in the semiconductor industry
CONTROLWORKS
CONTROLWORKS
Trademark
Word
Previous
REGISTERED
Owner:
Serial:77103185
Filed:Feb 8, 2007
Classes:9
Registration:3421460
Registered:May 6, 2008
Description: Downloadable computer programs for controlling semiconductor device manufacturing processes and equipment
GENESIS
GENESIS
Trademark
Word
Previous
CANCELLED
Owner:
Serial:78354473
Filed:Jan 20, 2004
Classes:9
Registration:2985162
Registered:Aug 16, 2005
Description: Computer software used in the design and manufacture of semiconductor chips and flat panel displays
PRECISIONWORX
PRECISIONWORX
Trademark
Word
Previous
REGISTERED
Owner:
Serial:76364759
Filed:Jan 28, 2002
Classes:9
Registration:2840951
Registered:May 11, 2004
Description: HARDWARE AND SOFTWARE SYSTEMS COMPRISING COMPUTERS, COMPUTER SOFTWARE, ELECTRONIC HARDWARE AND MECHANICAL HARDWARE FOR MICROPOSITIONING CONTROL, NAMELY, THE DESIGN, MANUFACTURE AND APPLICATION OF MICROPOSITIONING CONTROL IN PRECISION ACTUATORS, CONTROL SYSTEMS FOR PHOTONICS, DIGITAL FLOW CONTROL, SEMICONDUCTOR TEST AND INSPECTION [, AND BIOMEDICAL MICROSCOPY AND SCANNING SYSTEMS ]
WAFERWORX
WAFERWORX
Trademark
Word
Previous
CANCELLED
Owner:
Serial:76117626
Filed:Aug 28, 2000
Classes:9
Registration:2568361
Registered:May 7, 2002
NSX
NSX
Trademark
Word
Previous
REGISTERED
Owner:
Serial:76038964
Filed:May 2, 2000
Classes:9
Registration:2742760
Registered:Jul 29, 2003
Description: Inspection equipment and devices, namely, equipment and devices that sense and/or capture images of semiconductor and electronic related components including semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and automatically inspect these images for information such as defects, coordinate or position determination, identification, and/or presence or absence of something thereon
YIELD BASE
YIELD BASE
Trademark
Word
Previous
CANCELLED
Owner:
Serial:75732866
Filed:Jun 21, 1999
Classes:9
Registration:2594836
Registered:Jul 16, 2002
Description: Computer software for the semiconductor manufacturing process for the purpose of data storage to improve the manufacturing process and product design and users' manuals sold together as a unit; "yield"
YIELD DYNAMICS
YIELD DYNAMICS
Trademark
Word
Previous
CANCELLED
Owner:
Serial:75732970
Filed:Jun 21, 1999
Classes:9
Registration:2579314
Registered:Jun 11, 2002
Description: Computer software for the semiconductor manufacturing process for the purpose of data analysis and data storage to improve the manufacturing process and product design and users' manuals sold together as a unit; "YIELD"
FLEXTRACT
FLEXTRACT
Trademark
Word
Previous
CANCELLED
Owner:
Serial:75694239
Filed:Apr 27, 1999
Classes:9
Registration:2564108
Registered:Apr 23, 2002
Description: Computer software for the semiconductor manufacturing process for the purpose of data access to improve the manufacturing process and products design and users' manuals sold together as a unit
YIELD MINE
YIELD MINE
Trademark
Word
Previous
CANCELLED
Owner:
Serial:75694238
Filed:Apr 27, 1999
Classes:9
Registration:2556570
Registered:Apr 2, 2002
Description: Computer software for the semiconductor manufacturing process for the purpose of data analysis and data storage to improve the manufacturing process and product design and users' manuals sold together as a unit; "YIELD"
SPECTRALASER
SPECTRALASER
Trademark
Word
Previous
CANCELLED
Owner:
Serial:75259026
Filed:Mar 18, 1997
Classes:9
Registration:2248114
Registered:May 25, 1999
Description: Ellipsometer based apparatus for transparent film thickness measurement for use in the semiconductor, disk drive, magnetic data storage, optical data storage, thin films and coatings industries
VANGUARD
VANGUARD
Trademark
Word
Previous
CANCELLED
Owner:
Serial:75259027
Filed:Mar 18, 1997
Classes:9
Registration:2312196
Registered:Jan 25, 2000
Description: Apparatus for film thickness measurement, namely, ellipsometers, spectroscopic ellipsometers, reflectometers, spectroscopic reflectometers, picosecond ultrasonic laser sonar equipment, and film resistance measurement equipment for use in the semiconductor, disk drive, magnetic data storage, optical data storage, thin films and coating industries
METAPULSE
METAPULSE
Trademark
Word
Previous
REGISTERED
Owner:
Serial:75247830
Filed:Feb 25, 1997
Classes:9
Registration:2202118
Registered:Nov 3, 1998
Description: Instruments for the measurement of thicknesses and adhesion properties of metal and opaque films
PROCESSWORKS
PROCESSWORKS
Trademark
Word
Previous
REGISTERED
Owner:
Serial:74658890
Filed:Apr 10, 1995
Classes:9
Registration:2173284
Registered:Jul 14, 1998
Description: Computer programs for use in process control applications used in the field semiconductors