TERADYNE, INC. logo

TERADYNE, INC.

116 Marks
Corp.
First Filed:Aug 28, 1964Latest Filed:Apr 23, 2024Address:600 Riverpark Drive, North Reading, MA 01864

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Class 9
Electronics, Software & Scientific Equipment
111(96%)
Class 42
Software, IT Services & Scientific Research
4(3%)
Class 21
Kitchen Utensils & Household Containers
2(2%)

TTAB Proceedings

Total Proceedings
7
As Plaintiff
4(57%)
As Defendant
3(43%)

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Trademark Activity Timeline(1980 – 2025)

Trademark Portfolio

138 results

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Filed
Registered
Last Activity
TERADYNE TITAN
TERADYNE TITAN
Trademark
Word
REGISTERED
Owner:
Serial:98515054
Filed:Apr 23, 2024
Classes:9
Registration:7661937
Registered:Jan 21, 2025
Description: Semiconductor testing apparatus; Computer component testing and calibrating equipment; computer hardware for testing and analyzing computer hardware, memory and logic devices, semiconductors and chips; recorded computer software for testing and analyzing computer hardware, memory and logic devices, semiconductors and chips
FLEXSTUDIO
FLEXSTUDIO
Trademark
Word
PENDING
Owner:
Serial:98450445
Filed:Mar 14, 2024
Classes:9, 42
Description: Semiconductor testing apparatus; downloadable computer software development tools; downloadable and recorded computer software for testing and analyzing computer hardware, semiconductors and chips, circuit boards, memory and logic devices, and data networks; Design and development of computer software for others; providing temporary use of non-downloadable cloud-based software for testing and analyzing computer hardware, semiconductors and chips, circuit boards, memory and logic devices, and data networks
TERADYNE SATURN
TERADYNE SATURN
Trademark
Word
REGISTERED
Owner:
Serial:98247831
Filed:Oct 31, 2023
Classes:9
Registration:7549059
Registered:Oct 29, 2024
Description: Semiconductor testing apparatus; Computer component testing and calibrating equipment; Computer hardware for testing and analyzing computer hardware, memory and logic devices, semiconductors and chips; Recorded computer software for testing and analyzing computer hardware, memory and logic devices, semiconductors and chips
ULTRAFLEXPLUS
ULTRAFLEXPLUS
Trademark
Word
REGISTERED
Owner:
Serial:97677821
Filed:Nov 15, 2022
Classes:9
Registration:7248400
Registered:Dec 19, 2023
Description: Semiconductor testing apparatus; Computer component testing and calibrating equipment; computer hardware for testing and analyzing computer hardware, memory and logic devices, semiconductors and chips; recorded computer software for testing and analyzing computer hardware, memory and logic devices, semiconductors and chips
MAGNUM
MAGNUM
Trademark
Word
REGISTERED
Owner:
Serial:90642426
Filed:Apr 13, 2021
Classes:9
Registration:6716256
Registered:May 3, 2022
Description: High-speed computer memory testing machines; semiconductor testing machines; large scale integrated circuits testing machines; memory and logic device testing machines; diagnostic system, namely, computer hardware and downloadable computer software for testing and analyzing computer hardware, memory and logic devices, semiconductors and chips
FAIL LIST STREAMING
FAIL LIST STREAMING
Trademark
Word
ABANDONED
Owner:
Serial:88695983
Filed:Nov 18, 2019
Classes:9
FLS
FLS
Trademark
Word
REGISTERED
Owner:
Serial:88695991
Filed:Nov 18, 2019
Classes:9
Registration:6404425
Registered:Jun 29, 2021
Description: Computer hardware for testing semiconductors, circuit boards and memory and logic devices; Downloadable computer software for testing semiconductors, circuit boards and memory and logic devices; Diagnostic system, namely, computer hardware and downloadable computer software for testing and analyzing computer hardware, memory and logic devices, semiconductors and chips
IG-XL
IG-XL
Trademark
Word
CANCELLED
Owner:
Serial:77599971
Filed:Oct 24, 2008
Classes:9
Registration:3678885
Registered:Sep 8, 2009
77554751
77554751
Trademark
Design
CANCELLED
Owner:
Serial:77554751
Filed:Aug 25, 2008
Classes:9
Registration:3782019
Registered:Apr 27, 2010
NEPTUNE
NEPTUNE
Trademark
Combined
REGISTERED
Owner:
Serial:77552180
Filed:Aug 21, 2008
Classes:9
Registration:3764364
Registered:Mar 23, 2010
Description: Test equipment for electronic devices, namely, mass storage devices
NEPTUNE
NEPTUNE
Trademark
Word
CANCELLED
Owner:
Serial:77433515
Filed:Mar 27, 2008
Classes:9
Registration:3772302
Registered:Apr 6, 2010
OPENFLEX
OPENFLEX
Trademark
Word
ABANDONED
Owner:
Serial:77414772
Filed:Mar 6, 2008
Classes:9
OPENFLEX CERTIFIED
OPENFLEX CERTIFIED
Trademark
Word
ABANDONED
Owner:
Serial:77414780
Filed:Mar 6, 2008
Classes:9
Description: "CERTIFIED"
BECAUSE TESTING MATTERS
BECAUSE TESTING MATTERS
Trademark
Word
CANCELLED
Owner:
Serial:77397887
Filed:Feb 15, 2008
Classes:9
Registration:3938268
Registered:Mar 29, 2011
TERADYNE SELECT PARTNER
TERADYNE SELECT PARTNER
Trademark
Word
CANCELLED
Owner:
Serial:77078067
Filed:Jan 8, 2007
Classes:9
Registration:3715674
Registered:Nov 24, 2009
ZSCOPE
ZSCOPE
Trademark
Word
CANCELLED
Owner:
Serial:77074065
Filed:Jan 1, 2007
Classes:9
Registration:3416773
Registered:Apr 29, 2008
ZTEC
ZTEC
Trademark
Combined
CANCELLED
Owner:
Serial:77074057
Filed:Jan 1, 2007
Classes:9
Registration:3416772
Registered:Apr 29, 2008
ZTEC
ZTEC
Trademark
Word
CANCELLED
Owner:
Serial:77074054
Filed:Jan 1, 2007
Classes:9
Registration:3542417
Registered:Dec 9, 2008
ZWAVE
ZWAVE
Trademark
Word
CANCELLED
Owner:
Serial:77074068
Filed:Jan 1, 2007
Classes:9
Registration:3416774
Registered:Apr 29, 2008
BECAUSE TESTING MATTERS
BECAUSE TESTING MATTERS
Trademark
Word
ABANDONED
Owner:
Serial:77041144
Filed:Nov 10, 2006
Classes:9
MICRO FLEX
MICRO FLEX
Trademark
Word
ABANDONED
Owner:
Serial:78765572
Filed:Dec 2, 2005
Classes:9
ULTRA FLEX
ULTRA FLEX
Trademark
Word
REGISTERED
Owner:
Serial:78765575
Filed:Dec 2, 2005
Classes:9
Registration:3250770
Registered:Jun 12, 2007
Description: Testing apparatus for testing semiconductors
FLEX
FLEX
Trademark
Combined
REGISTERED
Owner:
Serial:78764696
Filed:Dec 1, 2005
Classes:9
Registration:3255049
Registered:Jun 26, 2007
Description: Testing apparatus for testing semiconductors
IG-XL
IG-XL
Trademark
Word
ABANDONED
Owner:
Serial:78667174
Filed:Jul 11, 2005
Classes:9
OPENFLEX
OPENFLEX
Service Mark
Word
ABANDONED
Owner:
Serial:78664579
Filed:Jul 6, 2005
Classes:42
OPENFLEX CERTIFIED
OPENFLEX CERTIFIED
Certification
Word
ABANDONED
Owner:
Serial:78664610
Filed:Jul 6, 2005
Classes:N/A
Description: CERTIFIED
XSTATION
XSTATION
Trademark
Word
ABANDONED
Owner:
Serial:78611608
Filed:Apr 19, 2005
Classes:9
DELTASCAN
DELTASCAN
Trademark
Word
CANCELLED
Owner:
Serial:78602649
Filed:Apr 6, 2005
Classes:9
Registration:3073502
Registered:Mar 28, 2006
CLEARVUE
CLEARVUE
Trademark
Word
CANCELLED
Owner:
Serial:78598344
Filed:Mar 30, 2005
Classes:9
Registration:3776297
Registered:Apr 13, 2010
APTERA
APTERA
Trademark
Word
ABANDONED
Owner:
Serial:78514820
Filed:Nov 10, 2004
Classes:9
VICTORY
VICTORY
Trademark
Word
CANCELLED
Owner:
Serial:78401629
Filed:Apr 14, 2004
Classes:9
Registration:3026945
Registered:Dec 13, 2005
TERADYNE DESIGNLINK
TERADYNE DESIGNLINK
Service Mark
Word
CANCELLED
Owner:
Serial:78313801
Filed:Oct 15, 2003
Classes:42
Registration:2973943
Registered:Jul 19, 2005
HIGH PERFORMANCE CIRCUITS
HIGH PERFORMANCE CIRCUITS
Trademark
Word
ABANDONED
Owner:
Serial:78307273
Filed:Sep 30, 2003
Classes:9
HPC
HPC
Trademark
Word
ABANDONED
Owner:
Serial:78307257
Filed:Sep 30, 2003
Classes:9
DCT
DCT
Trademark
Word
ABANDONED
Owner:
Serial:78297347
Filed:Sep 8, 2003
Classes:9
SIMULYZER
SIMULYZER
Trademark
Word
CANCELLED
Owner:
Serial:78294013
Filed:Aug 29, 2003
Classes:9
Registration:2953600
Registered:May 17, 2005
HD-OPTYX
HD-OPTYX
Trademark
Word
ABANDONED
Owner:
Serial:78240989
Filed:Apr 23, 2003
Classes:9
TERADYNE
TERADYNE
Trademark
Word
REGISTERED
Owner:
Serial:76420068
Filed:Jun 13, 2002
Classes:9
Registration:2709152
Registered:Apr 22, 2003
Description: Automatic test equipment for electronic devices, namely semiconductor chips, printed circuit boards, electronic assemblies, and data networks
NETFLARE
NETFLARE
Trademark
Word
ABANDONED
Owner:
Serial:76347657
Filed:Dec 11, 2001
Classes:9
Description: COMPUTER SOFTWARE FOR TESTING, DIAGNOSING, ANALYZING OR CHARACTERIZING A DATA NETWORK
FORCE/SCE
FORCE/SCE
Trademark
Word
ABANDONED
Owner:
Serial:76271362
Filed:Jun 13, 2001
Classes:9
Description: PRINTED CIRCUIT BOARD AND INTEGRATED CIRCUIT TESTERS AND COMPUTER SOFTWARE FOR USE IN OPERATING PRINTED CIRCUIT BOARD AND INTEGRATED CIRCUIT TESTERS; PRINTED CIRCUIT BOARD AND INTEGRATED CIRCUIT INSPECTION STATIONS AND COMPUTER SOFTWARE FOR USE IN THE INSPECTION OF PRINTED CIRCUIT BOARDS AND INTEGRATED CIRCUITS; AUTOMATED VISUAL INSPECTION STATIONS FOR PRINTED CIRCUIT BOARDS AND INTEGRATED CIRCUITS AND COMPUTER SOFTWARE FOR USE IN THE INSPECTION OF PRINTED CIRCUIT BOARDS AND INTEGRATED CIRCUITS; COMPUTER HARDWARE AND SOFTWARE FOR PROVIDING ELECTRONICS FACTORY INFORMATION; COMPUTER HARDWARE AND SOFTWARE FOR ANALYZING OR MAKING DIAGNOSES RELATING TO AUTOMOTIVE PROBLEMS
FORCE
FORCE
Trademark
Word
ABANDONED
Owner:
Serial:76269622
Filed:Jun 11, 2001
Classes:9
Description: PRINTED CIRCUIT BOARD AND INTEGRATED CIRCUIT TESTERS AND COMPUTER SOFTWARE FOR USE IN OPERATING PRINTED CIRCUIT BOARD AND INTEGRATED CIRCUIT TESTERS; PRINTED CIRCUIT BOARD AND INTEGRATED CIRCUIT INSPECTION STATIONS AND COMPUTER SOFTWARE FOR USE IN THE INSPECTION OF PRINTED CIRCUIT BOARDS AND INTEGRATED CIRCUITS; AUTOMATED VISUAL INSPECTION STATIONS FOR PRINTED CIRCUIT BOARDS AND INTEGRATED CIRCUITS AND COMPUTER SOFTWARE FOR USE IN THE INSPECTION OF PRINTED CIRCUIT BOARDS AND INTEGRATED CIRCUITS; COMPUTER HARDWARE AND SOFTWARE FOR PROVIDING ELECTRONICS FACTORY INFORMATION; COMPUTER HARDWARE AND SOFTWARE FOR ANALYZING OR MAKING DIAGNOSES RELATING TO AUTOMOTIVE PROBLEMS
GBX
GBX
Trademark
Word
ABANDONED
Owner:
Serial:76188595
Filed:Jan 2, 2001
Classes:9
VHDM HSD
VHDM HSD
Trademark
Word
ABANDONED
Owner:
Serial:76160408
Filed:Nov 4, 2000
Classes:9
Description: "HSD"
E-MANAGER
E-MANAGER
Trademark
Word
CANCELLED
Owner:
Serial:76101853
Filed:Aug 2, 2000
Classes:9
Registration:2712214
Registered:Apr 29, 2003
TERADYNE
TERADYNE
Trademark
Word
ABANDONED
Owner:
Serial:76051243
Filed:May 18, 2000
Classes:9
AUTOTUNE
AUTOTUNE
Trademark
Word
ABANDONED
Owner:
Serial:76043432
Filed:May 8, 2000
Classes:9
EJB-LOAD
EJB-LOAD
Trademark
Stylized
ABANDONED
Owner:
Serial:76043411
Filed:May 8, 2000
Classes:9
EJB-MONITOR
EJB-MONITOR
Trademark
Stylized
ABANDONED
Owner:
Serial:76043430
Filed:May 8, 2000
Classes:9
EJB-TEST
EJB-TEST
Trademark
Stylized
ABANDONED
Owner:
Serial:76042993
Filed:May 8, 2000
Classes:9
EJB-TESTER
EJB-TESTER
Trademark
Stylized
ABANDONED
Owner:
Serial:76043431
Filed:May 8, 2000
Classes:9
EJB-TEST SUITE
EJB-TEST SUITE
Trademark
Stylized
ABANDONED
Owner:
Serial:76043410
Filed:May 8, 2000
Classes:9
TESTADVISOR
TESTADVISOR
Trademark
Word
ABANDONED
Owner:
Serial:76024930
Filed:Apr 13, 2000
Classes:9
EMPIRIX
EMPIRIX
Trademark
Word
CANCELLED
Owner:
Serial:76013970
Filed:Mar 31, 2000
Classes:9
Registration:2518703
Registered:Dec 11, 2001
EMPIRYX
EMPIRYX
Trademark
Word
ABANDONED
Owner:
Serial:76013969
Filed:Mar 31, 2000
Classes:9
AUTOPUB
AUTOPUB
Trademark
Word
ABANDONED
Owner:
Serial:76009970
Filed:Mar 23, 2000
Classes:9
E-SENTINEL
E-SENTINEL
Trademark
Word
ABANDONED
Owner:
Serial:76007505
Filed:Mar 23, 2000
Classes:9
NETFLARE
NETFLARE
Trademark
Word
ABANDONED
Owner:
Serial:75867808
Filed:Dec 9, 1999
Classes:9
Description: Apparatus for testing and analysis of a communications network
CELERITY
CELERITY
Trademark
Word
ABANDONED
Owner:
Serial:75852236
Filed:Nov 18, 1999
Classes:9
Description: Apparatus for testing and qualifying high speed lines in a communications network
JAVELIN
JAVELIN
Trademark
Word
ABANDONED
Owner:
Serial:75831971
Filed:Oct 27, 1999
Classes:9
Description: AUTOMATED, ELECTRONIC TESTER FOR TESTING PRINTED CIRCUIT BOARDS AND OTHER ELECTRONIC ASSEMBLIES
ISOLUTION
ISOLUTION
Service Mark
Word
ABANDONED
Owner:
Serial:75820880
Filed:Oct 12, 1999
Classes:35
Description: Network fault analysis and resolution services
ISOLUTION
ISOLUTION
Trademark
Word
ABANDONED
Owner:
Serial:75820881
Filed:Oct 12, 1999
Classes:9
Description: Apparatus for isolating and resolving faults in a communications network
TESTMYBEANS
TESTMYBEANS
Service Mark
Word
CANCELLED
Owner:
Serial:75816305
Filed:Oct 7, 1999
Classes:42
Registration:2456826
Registered:Jun 5, 2001
Description: PROVIDING TECHNICAL ASSISTANCE, CONSULTATION, AND SOFTWARE TESTING SERVICES IN THE FIELD OF COMPUTER SOFTWARE DEVELOPMENT
NEXLEV
NEXLEV
Trademark
Word
ABANDONED
Owner:
Serial:75539336
Filed:Aug 20, 1998
Classes:9
Description: Electrical Connectors
ARGO
ARGO
Trademark
Word
ABANDONED
Owner:
Serial:75353437
Filed:Sep 8, 1997
Classes:9
Description: Testing systems for high speed memory
ARIES
ARIES
Trademark
Word
CANCELLED
Owner:
Serial:75353438
Filed:Sep 8, 1997
Classes:9
Registration:2373305
Registered:Aug 1, 2000
Description: Semiconductor memory testing system comprised of a work station, tester body, test head and component handler
BOP
BOP
Trademark
Word
ABANDONED
Owner:
Serial:75093421
Filed:Apr 24, 1996
Classes:9
Description: Electrical connectors
MULTISCAN
MULTISCAN
Trademark
Word
ABANDONED
Owner:
Serial:74635370
Filed:Feb 17, 1995
Classes:9
Description: Hardware and software for use in automatic test equipment for the purpose of circuit board testing
TESTMASTER
TESTMASTER
Trademark
Word
ABANDONED
Owner:
Serial:74635371
Filed:Feb 17, 1995
Classes:9
Description: Computer software to generate programs and routines to test other computer software and systems
DELTASCAN
DELTASCAN
Trademark
Word
CANCELLED
Owner:
Serial:74614030
Filed:Dec 20, 1994
Classes:9
Registration:2010924
Registered:Oct 22, 1996
Description: Hardware and software for use in computer controlled automatic test equipment for the purpose of circuit board or circuit assembly testing
FRAMESCAN
FRAMESCAN
Trademark
Word
ABANDONED
Owner:
Serial:74614029
Filed:Dec 20, 1994
Classes:9
Description: Hardware and software for use in computer controlled automatic test equipment for the purpose of circuit board or circuit assembly testing
QUICKSCAN
QUICKSCAN
Trademark
Word
ABANDONED
Owner:
Serial:74614026
Filed:Dec 20, 1994
Classes:9
Description: Hardware and software for use in computer controlled automatic test equipment fo r the purpose of circuit board or circuit assembly testing
LINEWATCH
LINEWATCH
Trademark
Word
ABANDONED
Owner:
Serial:74610706
Filed:Dec 13, 1994
Classes:9
Description: Devices for testing telephone lines and computer software used in the test of telephone lines
WAVESCAN
WAVESCAN
Trademark
Word
ABANDONED
Owner:
Serial:74599686
Filed:Nov 16, 1994
Classes:9
Description: Computer hardware and software for use in computer controlled automatic test equipment used in testing computer circuit boards
Z1805VP
Z1805VP
Trademark
Word
ABANDONED
Owner:
Serial:74584409
Filed:Oct 11, 1994
Classes:9
Description: Electronic testing apparatus for use in testing electrical properties of connected electrical components
Z1880VP
Z1880VP
Trademark
Word
ABANDONED
Owner:
Serial:74584200
Filed:Oct 11, 1994
Classes:9
Description: Electronic testing apparatus for use in testing electrical properties of connected electrical components
Z1890VP
Z1890VP
Trademark
Word
ABANDONED
Owner:
Serial:74584199
Filed:Oct 11, 1994
Classes:9
Description: Electronic testing apparatus for use in testing electrical properties of connected electrical components
VECTOR PERFORMANCE
VECTOR PERFORMANCE
Trademark
Word
CANCELLED
Owner:
Serial:74485363
Filed:Feb 1, 1994
Classes:9
Registration:1902479
Registered:Jul 4, 1995
Description: Automatic test equipment comprising in-circuit test units for testing the electrical properties of electrical components; "VECTOR"
PROMPTEST
PROMPTEST
Trademark
Word
ABANDONED
Owner:
Serial:74423695
Filed:Aug 12, 1993
Classes:9
Description: In-circuit test systems comprising automatic test equipment for testing the electrical properties of connected electrical components
SAFECRACKER
SAFECRACKER
Trademark
Word
CANCELLED
Owner:
Serial:74423956
Filed:Aug 12, 1993
Classes:9
Registration:1892605
Registered:May 2, 1995
Description: Computer hardware and programs used for testing computer circuitry
Z1850VP
Z1850VP
Trademark
Word
CANCELLED
Owner:
Serial:74410897
Filed:Jul 7, 1993
Classes:9
Registration:1899677
Registered:Jun 13, 1995
Description: Electronic testing apparatus for use in testing electrical properties of connected electrical components