TMX Scientific, Inc.

Description: Computer software for statistics-driven sub-micron optical image data processing

Description: Computer services, namely, electronic imaging and measurement of surface temperature fields of active microelectronics; technology consultation and research in the field of microelectronics and semiconductors; research in the area of semiconductor processing technology

Description: Technology consultation and research in the field of microelectronics and semiconductors; Technical consultancy in relation to the production of semiconductors; Research in the area of semiconductor processing technology

Description: An optical metrology inspection system comprised of a light source, one or more cameras and sensors in communication with computer software and hardware; Optical inspection apparatus for industrial use; Scientific apparatus, namely, sensing and signaling devices for measurement and quality control of materials processing by laser; Electronic instruments for use in remote inspection and measurement of industrial components using remote visual devices; Sensors for the determination of temperatures, positions and distances; Testing equipment for measuring the temperature, pressure, position or form of workpieces in a machine tool; Temperature sensors

Description: Computer software platforms for simulating the thermal behavior of microelectronic devices