GleanMark

PARTICLE MEASURING SYSTEMS Trademark

PARTICLE MEASURING SYSTEMS is a USPTO trademark filed by Particle Measuring Systems, Inc.. Status: Registered.

Trademark Facts

MarkPARTICLE MEASURING SYSTEMS
Serial Number77056660
Registration Number3397110
StatusRegistered
Filing Date2006-12-04
Registration Date2008-03-18
Mark TypeWord
Nice Classes009 (Electronics & Software)
OwnerParticle Measuring Systems, Inc.
Attorney of RecordGary B. Chapman
Prosecution Events34
Latest EventTCCA on 2018-05-30

Goods & Services

Computer software and hardware for use in sensing, monitoring, and analyzing various solid, liquid and gaseous contaminants; software and hardware for counting contaminant particles; software and hardware for monitoring polishing and planarization slurries; software and hardware for continuous monitoring of hydrogen peroxide concentrations; cleanliness testing stations comprised in part of computer hardware, computer software, or computer peripherals | Installation, maintenance and repair services, namely, installation, maintenance and repair of computer hardware for: sensing, monitoring, and analyzing various solid, liquid and gaseous contaminants; sensing, monitoring, and analyzing hydrogen peroxide concentrations; counting contaminant particles; monitoring polishing and planarization slurries; and cleanliness testing | Education and training services, namely, offering training programs and seminars tailored to the operation, maintenance, repair and calibration of systems for: sensing, monitoring, and analyzing various solid, liquid and gaseous contaminants; sensing, monitoring, and analyzing hydrogen peroxide concentrations; counting contaminant particles; monitoring polishing and planarization slurries; and cleanliness testing | Installation, maintenance and repair services, namely, installation, maintenance and repair of computer software for: sensing, monitoring, and analyzing various solid, liquid and gaseous contaminants; sensing, monitoring, and analyzing hydrogen peroxide concentrations; counting contaminant particles; monitoring polishing and planarization slurries; and cleanliness testing; development of computer programs for manufacturing process characterization and design relating to contaminants, cleanliness, and hydrogen peroxide concentrations; development of computer programs for trouble shooting of manufacturing processes relating to contaminants, cleanliness, and hydrogen peroxide concentrations; development of computer programs for design of product validity procedures, testing methods and techniques related to contaminants, cleanliness, and hydrogen peroxide concentrations; development of computer programs for manufacturing site surveys related to contaminants, cleanliness, and hydrogen peroxide concentrations; development of computer programs for on-site testing for contaminants, cleanliness, and hydrogen peroxide concentrations; development of computer programs for microcontamination testing services; development of computer programs for laboratory testing for contaminants, cleanliness and hydrogen peroxide concentrations

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