FEI COMPANY

Description: Semiconductor testing apparatus

Description: Transmission electron microscopes

Description: Providing laboratory research services in the field of electron microscopy, namely, grid reparation, data collection, data assessment and scientific support of daily operation of electron microscopy workflows

Description: Acoustical insulation barrier panels; architectural acoustic products, namely, sound absorbers and sound diffusers; electric, thermal, and acoustic insulators; sound-control flooring underlayment made of insulating materials

Description: Software as a service (SaaS) featuring software for operating, monitoring, and managing electron microscopy systems, for enabling remote operation and control of microscopes, for monitoring microscopy system performance, environmental conditions, and equipment utilization, for enhancing image resolution and data quality, and for providing analytics, diagnostics, and reporting on microscopy system health and productivity

Description: Advisory services relating to the installation of scientific and laboratory equipment being microscopes, namely, preparing, assessing, and optimizing laboratory and research environments for equipment installation; conducting site inspections for installation purposes, namely, inspection services in the course of construction of laboratories and the installation of scientific and laboratory equipment; turnkey installation services relating to the installation of scientific and laboratory equipment, namely, preparing installation sites, performing equipment infrastructure setup, installing and calibrating laboratory and imaging equipment being microscopes, and delivering fully operational systems ready for use

Description: Providing laboratory research services in the field of electron microscopy including grid preparation, data collection, data assessment and scientific support of daily operation of electron microscopy workflows

Description: Downloadable software application to automate laboratory measurements

Description: Semiconductor testing apparatus, namely, a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for semiconductor analysis

Description: Providing online non-downloadable workflow management software

Description: Downloadable workflow management software

Description: Transmission electron microscope (TEM)

Description: Laboratory instrument, namely, a scanning electron microscope for material imaging and analysis

Description: Scanning transmission electron microscope for sample preparation and imaging analysis in the field of semiconductors

Description: Laboratory apparatus, namely, a container for holding biological samples to be viewed on an electron microscope

Description: Laboratory instrument, namely, ion milling machines for preparing specimens for observation with an electron microscope

Description: Cryo dual-beam electron microscope

Description: Laboratory apparatus, namely, an optical instrument for imaging inside an electron microscope

Description: Providing demonstration of products in the field of electron microscopes | Providing facilities for educational training in the field of electron microscopes

Description: Electron microscope

Description: Electron microscope

Description: Electron microscope

Description: Electron microscope

Description: Laboratory instrument for processing samples for single particle analysis and/or cryo-tomography research applications

Description: Electron microscope

Description: High brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy and mask repair; focused electron beam columns for electron beam lithography, electron beam microscopy, and liquid metal ion sources

Description: High brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy and mask repair; focused electron beam columns for electron beam lithography, electron beam microscopy, and liquid metal ion sources

Description: High brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy and mask repair; focused electron beam columns for electron beam lithography, electron beam microscopy, and liquid metal ion sources

Description: "COMPANY TOOLS FOR NANOTECH"

Description: HIGH BRIGHTNESS, SUBMICRON ION AND ELECTRON BEAM COLUMNS USING FIELD EMISSION TECHNOLOGY; NAMELY, FOCUSED ION BEAM COLUMNS FOR ION LITHOGRAPHY, ION BEAM MILLING, SECONDARY ION MASS SPECTROSCOPY AND MASK REPAIR; FOCUSED ELECTRON BEAM COLUMNS FOR ELECTRON BEAM LITHOGRAPHY AND ELECTRON BEAM MICROSCOPY; SINGLE CRYSTAL SOURCE MATERIALS; NAMELY, REFRACTORY METALS, LaB, MINI-VOGEL MOUNT CATHODES, CeB, MINI-VOGEL MOUNT CATHODES, CONTROL GRID ELECTRODES, NAMELY, REBUILT WEHNELT, COLD FIELD EMITTERS, SCHOTTKY EMITTERS, AND LIQUID METAL ION SOURCES

Description: HIGH BRIGHTNESS, SUBMICRON ION AND ELECTRON BEAM COLUMNS USING FIELD EMISSION TECHNOLOGY; NAMELY, FOCUSED ION BEAM COLUMNS FOR ION LITHOGRAPHY, ION BEAM MILLING, SECONDARY ION MASS SPECTROSCOPY, FOCUSED ELECTRON BEAM COLUMNS FOR ELECTRON BEAM LITHOGRAPHY, AND ELECTRON BEAM MICROSCOPY; SINGLE CRYSTAL SOURCE MATERIALS; NAMELY, REFRACTORY METALS, LaB6 MINI-VOGEL MOUNT CATHODES, CeB6 MINI-VOGEL MOUNT CATHODES, WEHNELT REBUILDING SERVICE, COLD FIELD EMITTERS, SCHOTTKY EMITTERS, AND LIQUID METAL ION SOURCES; "BEAM TECHNOLOGY"

Description: Laboratory unit comprising one or more pieces of laboratory equipment, computer hardware, computer software and instruction manuals all sold as a unit for installation and use within an integrated circuit fabrication facility for sampling, testing, measuring, and altering integrated circuits and their manufacturing processes, and for reporting, transmitting in electronic form, and organizing information produced by the laboratory unit; and parts therefor; "LAB"

Description: High brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy, focused electron beam columns for electron beam lithography, and electron beam microscopy; single crystal source materials, namely, refractory metals, LaB6 mini-vogel cathodes, CeB6 mini-vogel mount cathodes, control grid electrodes, namely, rebuilt wehnelts; cold field emitters, schottky emitters, and liquid metal ion sources; "COMPONENTS"

Description: Software for use in semiconductor manufacturing

Description: Software for controlling semiconductor test inspection and/or manufacturing equipment

Description: Computer software programs for use in manufacturing of products

Description: Electron microscopes for environmental use

Description: Maintenance and repair services of electron microscopes

Description: High brightness, submicron focused ion and electron beam systems using field emission technology; namely, for ion beam micromachining, ion milling, ion lithography, ion microscopes, secondary ion mass spectroscopy, electron microscopes and combined ion beam milling/electron microscope systems; high brightness, submicron ion and electron beam columns using field emission technology; namely, ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy, electron beam lithography, and electron beam microscopy; single crystal source materials; namely, refractory metals, LaB6 Mini-Vogel Mount cathodes, cold field emitters, Schottky emitters, and liquid metal ion sources

Description: Electron microscopes