FEI COMPANY

Class 042: Providing laboratory research services in the field of electron microscopy, namely, grid reparation, data collection, data assessment and scientific support of daily operation of electron microscopy workflows

Class 017: Acoustical insulation barrier panels; architectural acoustic products, namely, sound absorbers and sound diffusers; electric, thermal, and acoustic insulators; sound-control flooring underlayment made of insulating materials

Class 042: Software as a service (SaaS) featuring software for operating, monitoring, and managing electron microscopy systems; for enabling remote operation and control of microscopes; for monitoring system performance, environmental conditions, and equipment utilization; for enhancing image resolution and data quality; and for providing analytics, diagnostics, and reporting on system health and productivity

Class 037: Site services, namely, preparing, assessing, and optimizing laboratory and research environments for equipment installation; conducting visual inspections, site measurements, and reporting; developing corrective action plans; providing computer-aided design (CAD) drawings and layout documentation; and consulting regarding facility readiness, infrastructure requirements, and environmental factors that may affect equipment performance; turnkey installation services, namely, preparing installation sites, performing environmental readiness and infrastructure setup, installing and calibrating laboratory and imaging equipment, including microscopes, and delivering fully operational systems ready for end-use

Providing laboratory research services in the field of electron microscopy including grid preparation, data collection, data assessment and scientific support of daily operation of electron microscopy workflows

Downloadable software application to automate laboratory measurements

Semiconductor testing apparatus, namely, a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for semiconductor analysis

Providing online non-downloadable workflow management software

Downloadable workflow management software

transmission electron microscope (TEM)

Laboratory instrument, namely, a scanning electron microscope for material imaging and analysis

Scanning transmission electron microscope for sample preparation and imaging analysis in the field of semiconductors

Laboratory apparatus, namely, a container for holding biological samples to be viewed on an electron microscope

Laboratory instrument, namely, ion milling machines for preparing specimens for observation with an electron microscope

cryo dual-beam electron microscope

Laboratory apparatus, namely, an optical instrument for imaging inside an electron microscope

Providing demonstration of products in the field of electron microscopes | Providing facilities for educational training in the field of electron microscopes

Electron microscope

Electron microscope

Electron microscope

Electron microscope

Laboratory instrument for processing samples for single particle analysis and/or cryo-tomography research applications

Electron microscope

high brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy and mask repair; focused electron beam columns for electron beam lithography, electron beam microscopy, and liquid metal ion sources

high brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy and mask repair; focused electron beam columns for electron beam lithography, electron beam microscopy, and liquid metal ion sources

high brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy and mask repair; focused electron beam columns for electron beam lithography, electron beam microscopy, and liquid metal ion sources

"COMPANY TOOLS FOR NANOTECH"

HIGH BRIGHTNESS, SUBMICRON ION AND ELECTRON BEAM COLUMNS USING FIELD EMISSION TECHNOLOGY; NAMELY, FOCUSED ION BEAM COLUMNS FOR ION LITHOGRAPHY, ION BEAM MILLING, SECONDARY ION MASS SPECTROSCOPY AND MASK REPAIR; FOCUSED ELECTRON BEAM COLUMNS FOR ELECTRON BEAM LITHOGRAPHY AND ELECTRON BEAM MICROSCOPY; SINGLE CRYSTAL SOURCE MATERIALS; NAMELY, REFRACTORY METALS, LaB, MINI-VOGEL MOUNT CATHODES, CeB, MINI-VOGEL MOUNT CATHODES, CONTROL GRID ELECTRODES, NAMELY, REBUILT WEHNELT, COLD FIELD EMITTERS, SCHOTTKY EMITTERS, AND LIQUID METAL ION SOURCES

HIGH BRIGHTNESS, SUBMICRON ION AND ELECTRON BEAM COLUMNS USING FIELD EMISSION TECHNOLOGY; NAMELY, FOCUSED ION BEAM COLUMNS FOR ION LITHOGRAPHY, ION BEAM MILLING, SECONDARY ION MASS SPECTROSCOPY, FOCUSED ELECTRON BEAM COLUMNS FOR ELECTRON BEAM LITHOGRAPHY, AND ELECTRON BEAM MICROSCOPY; SINGLE CRYSTAL SOURCE MATERIALS; NAMELY, REFRACTORY METALS, LaB6 MINI-VOGEL MOUNT CATHODES, CeB6 MINI-VOGEL MOUNT CATHODES, WEHNELT REBUILDING SERVICE, COLD FIELD EMITTERS, SCHOTTKY EMITTERS, AND LIQUID METAL ION SOURCES; "BEAM TECHNOLOGY"

Laboratory unit comprising one or more pieces of laboratory equipment, computer hardware, computer software and instruction manuals all sold as a unit for installation and use within an integrated circuit fabrication facility for sampling, testing, measuring, and altering integrated circuits and their manufacturing processes, and for reporting, transmitting in electronic form, and organizing information produced by the laboratory unit; and parts therefor; "LAB"

high brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy, focused electron beam columns for electron beam lithography, and electron beam microscopy; single crystal source materials, namely, refractory metals, LaB6 mini-vogel cathodes, CeB6 mini-vogel mount cathodes, control grid electrodes, namely, rebuilt wehnelts; cold field emitters, schottky emitters, and liquid metal ion sources; "COMPONENTS"

software for use in semiconductor manufacturing

software for controlling semiconductor test inspection and/or manufacturing equipment

computer software programs for use in manufacturing of products

electron microscopes for environmental use

maintenance and repair services of electron microscopes

high brightness, submicron focused ion and electron beam systems using field emission technology; namely, for ion beam micromachining, ion milling, ion lithography, ion microscopes, secondary ion mass spectroscopy, electron microscopes and combined ion beam milling/electron microscope systems; high brightness, submicron ion and electron beam columns using field emission technology; namely, ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy, electron beam lithography, and electron beam microscopy; single crystal source materials; namely, refractory metals, LaB6 Mini-Vogel Mount cathodes, cold field emitters, Schottky emitters, and liquid metal ion sources

electron microscopes