OCD
REGISTERED AND RENEWEDWord Mark
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Ownership
OI
Address
16 Jonspin Road
Wilmington, MA 01887
Critical Dates
First Use Date
Feb 15, 2002
Filing Date
Aug 13, 2001
Registration Date
Feb 3, 2004
Mark Descriptions
Goods
Class 9
metrology instrument utilizing an optical technique for measuring microscopic features on samples, namely, semiconductor wafers, flat panel displays and magnetic media
Mark Elements
Text Mark
OCD
Category
Trademark
Standard Characters
Yes
Color Claim
No
Trademark Timeline
Filing Date
First Use
Publication Date
Registration Date
USPTO Records
No documents found for this trademark.