NANODIFFRACT
REGISTERED AND RENEWEDWord Mark
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Ownership
OI
Address
16 Jonspin Road
Wilmington, MA 01887
Critical Dates
First Use Date
Dec 28, 2007
Filing Date
Jan 21, 2009
Registration Date
Sep 8, 2009
Mark Descriptions
Goods
Class 9
Optical Critical Dimension (OCD) computer software used for modeling and analysis of physical structures on semiconductor wafers and other substrates with microscopic features, contains a graphical user interface (GUI) which allows the user to model the structures in 2D and 3D, as well as perform sensitivity studies and other analytical functions...
Mark Elements
Text Mark
NANODIFFRACT
Category
Trademark
Standard Characters
No
Color Claim
No
Trademark Timeline
First Use
First Use in Commerce
Filing Date
Registration Date
USPTO Records
No documents found for this trademark.